Deep and shallow electronic states at ultrathin InAs insertions in GaAs investigated by capacitance spectroscopy

P. Krispin; J.-L. Lazzari; H. Kostial

doi:10.1063/1.368927

Deep and shallow electronic states at ultrathin InAs insertions in GaAs investigated by capacitance spectroscopy

Journal of Applied Physics ◽

10.1063/1.368927 ◽

1998 ◽

Vol 84 (11) ◽

pp. 6135-6140 ◽

Cited By ~ 24

Author(s):

P. Krispin ◽

J.-L. Lazzari ◽

H. Kostial

Keyword(s):

Electronic States ◽

Capacitance Spectroscopy

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The Electronic States of Some Metal Impurities in Germanium

Australian Journal of Physics ◽

10.1071/ph820053 ◽

1982 ◽

Vol 35 (1) ◽

pp. 53 ◽

Cited By ~ 3

Author(s):

SJ Pearton

Keyword(s):

Electrical Properties ◽

Cross Sections ◽

Energy Levels ◽

Electronic States ◽

Capture Cross ◽

Deep Impurity ◽

Impurity States ◽

Metal Impurities ◽

Capacitance Spectroscopy ◽

Capture Cross Sections

Capacitance spectroscopy measurements of the energy levels and majority carrier capture cross sections of deep impurity states associated with S, Zn, Pb and Bi in Ge are presented. Similarities in the electrical properties of these elements with other deep impurities in Ge are discussed.

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Integration of Core-Edge Spectroscopy Methods for the Study of Polymers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010016323x ◽

1996 ◽

Vol 54 ◽

pp. 154-155

Author(s):

E. G. Rightor

Keyword(s):

Excited State ◽

Polymer Blends ◽

Gas Phase ◽

Spatial Resolution ◽

High Spatial Resolution ◽

Electronic States ◽

Core Electron ◽

Bulk Solids ◽

Development Application

Core edge spectroscopy methods are versatile tools for investigating a wide variety of materials. They can be used to probe the electronic states of materials in bulk solids, on surfaces, or in the gas phase. This family of methods involves promoting an inner shell (core) electron to an excited state and recording either the primary excitation or secondary decay of the excited state. The techniques are complimentary and have different strengths and limitations for studying challenging aspects of materials. The need to identify components in polymers or polymer blends at high spatial resolution has driven development, application, and integration of results from several of these methods.

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