High resolution transmission electron microscopy characterization of fcc → 9R transformation in nanocrystalline palladium films due to hydriding

Behnam Amin-Ahmadi; Hosni Idrissi; Renaud Delmelle; Thomas Pardoen; Joris Proost; Dominique Schryvers

doi:10.1063/1.4793512

High resolution transmission electron microscopy characterization of fcc → 9R transformation in nanocrystalline palladium films due to hydriding

Applied Physics Letters ◽

10.1063/1.4793512 ◽

2013 ◽

Vol 102 (7) ◽

pp. 071911 ◽

Cited By ~ 16

Author(s):

Behnam Amin-Ahmadi ◽

Hosni Idrissi ◽

Renaud Delmelle ◽

Thomas Pardoen ◽

Joris Proost ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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High resolution Transmission Electron Microscopy characterization of a milled oxide dispersion strengthened steel powder

Journal of Nuclear Materials ◽

10.1016/j.jnucmat.2016.06.050 ◽

2016 ◽

Vol 479 ◽

pp. 76-84 ◽

Cited By ~ 7

Author(s):

M. Loyer-Prost ◽

J.-S. Merot ◽

J. Ribis ◽

Y. Le Bouar ◽

L. Chaffron ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Oxide Dispersion Strengthened ◽

Steel Powder ◽

Oxide Dispersion ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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X-ray diffraction and high resolution transmission electron microscopy characterization of intermetallics formed in Fe/Ti nanometer-scale multilayers during thermal annealing

Thin Solid Films ◽

10.1016/j.tsf.2009.04.027 ◽

2009 ◽

Vol 517 (24) ◽

pp. 6553-6557 ◽

Cited By ~ 1

Author(s):

Z.L. Wu ◽

T.X. Peng ◽

B.S. Cao ◽

M.K. Lei

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Nanometer Scale ◽

X Ray Diffraction ◽

X Ray ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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Transmission Electron Microscopy Characterization of Hydrothermal-treated Aluminum Film

10.1557/proc-1231-nn03-11 ◽

2009 ◽

Author(s):

Takashi Ishiguro ◽

Zhiyong Qiu ◽

Junichi Shimanuki ◽

Yusuke Hosoki

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Aluminum Film ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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Metallurgical study of Ni/(Ga,Al) As contacts. III. Transmission electron microscopy characterization of ternary superstructured phases in the reacted layers

Journal of Applied Physics ◽

10.1063/1.349718 ◽

1991 ◽

Vol 70 (12) ◽

pp. 7613-7619 ◽

Cited By ~ 13

Author(s):

A. Poudoulec ◽

B. Guenais ◽

A. Guivarc’h ◽

J. Caulet ◽

R. Guérin

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Metallurgical Study ◽

Microscopy Characterization

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Transmission Electron Microscopy Characterization of Position-Controlled InN Nanocolumns

Japanese Journal of Applied Physics ◽

10.1143/jjap.47.5330 ◽

2008 ◽

Vol 47 (7) ◽

pp. 5330-5332 ◽

Cited By ~ 18

Author(s):

Satoshi Harui ◽

Hidetoshi Tamiya ◽

Takanobu Akagi ◽

Hideto Miyake ◽

Kazumasa Hiramatsu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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Efficient Transmission Electron Microscopy Characterization of Cell–Nanostructure Interfacial Interactions

Journal of the American Chemical Society ◽

10.1021/jacs.0c05919 ◽

2020 ◽

Vol 142 (37) ◽

pp. 15649-15653

Author(s):

Stella Aslanoglou ◽

Yaping Chen ◽

Viola Oorschot ◽

Zlatan Trifunovic ◽

Eric Hanssen ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Interfacial Interactions ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization ◽

Efficient Transmission

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Transmission electron microscopy characterization of GaN nanowires

Journal of Electronic Materials ◽

10.1007/s11664-002-0089-4 ◽

2002 ◽

Vol 31 (5) ◽

pp. 391-394 ◽

Cited By ~ 2

Author(s):

Z. Liliental-Weber ◽

Y. H. Gao ◽

Y. Bando

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Gan Nanowires ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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Transmission electron microscopy characterization of plasma sprayed TiC coatings

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.572861 ◽

1985 ◽

Vol 3 (6) ◽

pp. 2475-2478 ◽

Cited By ~ 12

Author(s):

D. Fournier ◽

R. G. Saint‐Jacques ◽

C. Brunet ◽

S. Dallaire

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Plasma Sprayed ◽

Microscopy Characterization

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Transmission electron microscopy characterization of spark plasma sintered ZrB2 ceramic

Ceramics International ◽

10.1016/j.ceramint.2009.10.025 ◽

2010 ◽

Vol 36 (3) ◽

pp. 943-946 ◽

Cited By ~ 22

Author(s):

Takashi Mizuguchi ◽

Shuqi Guo ◽

Yutaka Kagawa

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Spark Plasma ◽

Microscopy Characterization

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Physical vapour deposition growth and transmission electron microscopy characterization of epitaxial thin metal films on single-crystal Si and Ge substrates

Philosophical Magazine A ◽

10.1080/01418610108214362 ◽

2001 ◽

Vol 81 (6) ◽

pp. 1547-1578 ◽

Cited By ~ 20

Author(s):

K. H. Westmacott ◽

S. Hinderberger ◽

U. Dahmen

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Single Crystal ◽

Vapour Deposition ◽

Metal Films ◽

Physical Vapour Deposition ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization

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