Flaw characterization using inversion of eddy current response and the effect of filters and scan resolution
2012 ◽
Vol 12
(8)
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pp. 2548-2553
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1997 ◽
Vol 33
(3)
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pp. 2258-2264
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1987 ◽
pp. 145-151
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Keyword(s):
2019 ◽
Vol 16
(9)
◽
pp. 1276-1285
2010 ◽
Vol 43
(6)
◽
pp. 493-500
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