Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams

1996 ◽  
Vol 39 (2) ◽  
pp. 193-196
Author(s):  
Anastas A Bukharaev
Keyword(s):  
Atomic Force Microscopy ◽  
Laser Beams ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Tunnelling

Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams

2013 ◽  
Vol 84 (8) ◽  
pp. 083701 ◽  
Author(s):  
Eika Tsunemi ◽  
Kei Kobayashi ◽  
Noriaki Oyabu ◽  
Masaharu Hirose ◽  
Yoshiko Takenaka ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Laser Beams ◽  
Beam Deflection ◽  
Incident Laser ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dual Probe

Atomic force microscopy and scanning tunnelling microscopy: Refining techniques for studying biomolecules

1994 ◽  
Vol 12 (4) ◽  
pp. 127-132 ◽  
Author(s):  
Clive J. Roberts ◽  
Philip M. Williams ◽  
Martyn C. Davies ◽  
David E. Jackson ◽  
Saul J.B. Tendler
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunnelling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Tunnelling ◽  
Tunnelling Microscopy
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