A numerical reconstruction method in inverse elastic scattering

2017 ◽  
Vol 25 (11) ◽  
pp. 1577-1600 ◽  
Author(s):  
F. S. V. Bazán ◽  
J. B. Francisco ◽  
K. H. Leem ◽  
G. Pelekanos ◽  
V. Sevroglou
Keyword(s):  
Elastic Scattering ◽  
Reconstruction Method ◽  
Numerical Reconstruction

Holographic Interference Electron Microscopy by Numerical Reconstruction Method

1990 ◽  
Vol 48 (1) ◽  
pp. 220-221
Author(s):  
Akinori Ohshita ◽  
Hiroshi Minamide ◽  
Yahachi Saito ◽  
Hiroshi Tomita
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Image Reconstruction ◽  
Thermionic Emission ◽  
Reconstructed Image ◽  
Reconstruction Method ◽  
Numerical Reconstruction ◽  
Emission Electron ◽  
Image Reconstruction Method ◽  
Propagation Function

Holographic interference electron microscopy has recently been put to practical use with a field-emission electron microscope. In this microscopy, the optical image reconstruction method are usually used, but many practical difficulties such as optical adjustment are always accompanied. On the other hand, the numerical image reconstruction method has many advantages. In this paper, therefore, holographic interference electron microscopy are tried by using a numerically reconstructed image.In the first step, an off-axis Fresnel electron hologram (Fig.1) was formed in a 100 kV thermionic-emission electron microscope equipped with an electron biprism. MgO smoke particles were used as a specimen. A reconstructed image is given by the convolution of amplitude transmittance of an electron hologram with propagation function from a hologram plane to an image reconstruction plane. In the second step for the numerical reconstruction, the hologram was enlarged and printed on a photographic paper.

scholarly journals Digital holographic reconstruction detection of localized corrosion arising from scratches

2010 ◽  
Vol 75 (4) ◽  
pp. 505-512 ◽  
Author(s):  
Liang Wang ◽  
Shenhao Chen ◽  
Boyu Yuan ◽  
Fanjiang Meng ◽  
Jianqiu Wang ◽  
...  
Keyword(s):  
Solution Concentration ◽  
Corrosion Process ◽  
Localized Corrosion ◽  
Reconstruction Technique ◽  
Reconstruction Method ◽  
Effective Technique ◽  
Direct Information ◽  
Numerical Reconstruction ◽  
Alloy 690 ◽  
Holographic Reconstruction

In this study, electrochemical methods and the digital holographic reconstruction technique were combined to detect the localized scratch-induced corrosion process of Alloy 690 in 0.5 mol dm-3 H2SO4 containing 0.1 mol dm-3 NaCl. The numerical reconstruction method has been proved to be an effective technique to detect changes of solution concentration. It can obtain direct information from the reconstructed images and capture subtle more revealing changes. It provides a method to detect localized corrosion arising from scratches.

Elastic Scattering in Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 252-253
Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Elastic Scattering ◽  
Cross Section ◽  
Quantum Noise ◽  
Dark Field ◽  
Elastic Cross Section ◽  
Biological Molecules ◽  
Dark Field Microscopy ◽  
Field Systems ◽  
Effects Of Radiation

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.

The Resolution and Contrast in Biological Sections Determined by Inelastic and Elastic Scattering

1973 ◽  
Vol 31 ◽  
pp. 224-225
Author(s):  
D. L. Misell
Keyword(s):  
Electron Microscopy ◽  
Adverse Effect ◽  
Elastic Scattering ◽  
Inelastic Scattering ◽  
Amorphous Carbon ◽  
Polymeric Materials ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Quantitative Estimates ◽  
Elastic Ratio

In the electron microscopy of biological sections the adverse effect of chromatic aberration on image resolution is well known. In this paper calculations are presented for the inelastic and elastic image intensities using a wave-optical formulation. Quantitative estimates of the deterioration in image resolution as a result of chromatic aberration are presented as an alternative to geometric calculations. The predominance of inelastic scattering in the unstained biological and polymeric materials is shown by the inelastic to elastic ratio, I/E, within an objective aperture of 0.005 rad for amorphous carbon of a thickness, t=50nm, typical of biological sections; E=200keV, I/E=16.

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

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