Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration

2004 ◽  
Vol 15 (7) ◽  
pp. 1337-1346 ◽  
Author(s):  
Peter J Cumpson ◽  
Charles A Clifford ◽  
John Hedley
Keyword(s):  
Atomic Force Microscopy ◽  
Spring Constant ◽  
Force Microscopy ◽  
Atomic Force ◽  
Reference Device

Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard

2007 ◽  
Vol 78 (9) ◽  
pp. 093705 ◽  
Author(s):  
E. D. Langlois ◽  
G. A. Shaw ◽  
J. A. Kramar ◽  
J. R. Pratt ◽  
D. C. Hurley
Keyword(s):  
Atomic Force Microscopy ◽  
Spring Constant ◽  
Transfer Standard ◽  
Force Microscopy ◽  
Atomic Force

Cantilever Spring-Constant Calibration in Atomic Force Microscopy

2007 ◽  
pp. 289-314 ◽  
Author(s):  
Peter J. Cumpson ◽  
Charles A. Clifford ◽  
Jose F. Portoles ◽  
James E. Johnstone ◽  
Martin Munz
Keyword(s):  
Atomic Force Microscopy ◽  
Spring Constant ◽  
Force Microscopy ◽  
Atomic Force

A Method for Calculating the Spring Constant of Atomic Force Microscopy Cantilevers with a Nonrectangular Cross Section

2005 ◽  
Vol 77 (4) ◽  
pp. 1192-1195 ◽  
Author(s):  
Mark A. Poggi ◽  
Andrew W. McFarland ◽  
Jonathan S. Colton ◽  
Lawrence A. Bottomley
Keyword(s):  
Atomic Force Microscopy ◽  
Cross Section ◽  
Spring Constant ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Michoscxpy-Feasibility for Materials Research.

1987 ◽  
Vol 111 ◽  
Author(s):  
P. J. Bryant ◽  
R. Yang ◽  
R. Miller
Keyword(s):  
Atomic Force Microscopy ◽  
Dielectric Materials ◽  
Spring Constant ◽  
Force Microscopy ◽  
Surface Areas ◽  
Atomic Force ◽  
Show Evidence ◽  
Materials Research ◽  
The Subject

AbstractThe applicability of atomic force microscopy (AFM) to both conductive and dielectric materials is the subject of this study. A representative conductor, Cu, and two dielectrics, mica and selenite, were examined. Microstructure and single lamellar steps were resolved. Surface areas on Cu and mica generated reproducible images when scanned repeatedly. There was no evidence of damage to the probe or the sample as a result of the AFM investigations. Selenite did show evidence of change after repeated scans with an AFM lever of 12 N/m spring constant exerting a 10−6N force.

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