Interpretation of the atomic scale contrast obtained on graphite and single-walled carbon nanotubes in the dynamic mode of atomic force microscopy

2005 ◽  
Vol 16 (3) ◽  
pp. S134-S137 ◽  
Author(s):  
Makoto Ashino ◽  
Alexander Schwarz ◽  
Hendrik Hölscher ◽  
Udo D Schwarz ◽  
Roland Wiesendanger
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Atomic Scale ◽  
Dynamic Mode ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Walled Carbon Nanotubes

Efficient Charge-Transfer from Diketopyrrolopyrroles to Single-Walled Carbon Nanotubes

Nanoscale ◽  
2021 ◽  
Author(s):  
Ilias Papadopoulos ◽  
Arjun Puthiyedath ◽  
Fabian Plass ◽  
Desiré Molina ◽  
Christina Harreiss ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Charge Transfer ◽  
Single Walled Carbon Nanotubes ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Efficient Charge ◽  
Walled Carbon Nanotubes ◽  
State Charge

In this contribution, the excited state charge-transfer interactions between single walled carbon nanotubes (SWCNTs) and a variety of phenyl, 4-bromophenyl, and thiophene substituted diketopyrrolopyrroles (DPPs), is described. Atomic force microscopy...

Fabrication of Selective Metal Contacts on Single-Walled Carbon Nanotubes for Device Applications

2005 ◽  
Vol 11 (S03) ◽  
pp. 106-109
Author(s):  
I. O. Maciel ◽  
B. R. A. Neves ◽  
A. P. Santos ◽  
C. A. Furtado ◽  
A. S. Ferlauto ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Research Area ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Sample Characterization ◽  
Active Research ◽  
Walled Carbon Nanotubes

Silicon based devices are expected to achieve the limit of possible downscaling in 10 to 15 years. Thus, the search of new materials to construct smaller, faster and more energy efficient devices has been a very active research area. Carbon nanotubes (CNTs) are very good candidates to construct nanoelectronic and nanophotonic devices [1,2,3] due to unique physical properties, such as its metallic or semiconducting characteristics depending only its diameter and chirality [4,5] and capability of caring high current densities (up to 1010A/cm2). In this work we develop nanofabrication techniques of single-walled carbon nanotubes (SWNTs) based devices using a combination of electron beam and optical lithography with Atomic Force Microscopy (AFM). We used both CVD-grown nanotubes [6] and HipCO-NTs [7] suspended on aqueous solution and deposited on the substrate. Atomic Force Microscopy (AFM) in tapping mode (Multimode Nanoscope IV, Digital Instruments) was used to CVD sample characterization, study of CNT deposition and to localize and index the nanotubes on substrate using lithography patterns as references, making possible to selectively construct metallic contacts on the CNTs.

Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3707-3710 ◽  
Author(s):  
Nami Choi ◽  
Takayuki Uchihashi ◽  
Hidehiro Nishijima ◽  
Takao Ishida ◽  
Wataru Mizutani ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Single Walled Carbon Nanotubes ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Walled Carbon Nanotubes
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