scholarly journals Direct observation of site-specific dopant substitution in Si doped (Al x Ga1− x )2O3 via atom probe tomography

2021 ◽  
Vol 54 (18) ◽  
pp. 184001
Author(s):  
Jith Sarker ◽  
A F M Anhar Uddin Bhuiyan ◽  
Zixuan Feng ◽  
Hongping Zhao ◽  
Baishakhi Mazumder
Author(s):  
Woo Jun Kwon ◽  
Jisu Ryu ◽  
Christopher H. Kang ◽  
Michael B. Schmidt ◽  
Nicholas Croy

Abstract Focused ion beam (FIB) microscopy is an essential technique for the site-specific sample preparation of atom probe tomography (APT). The site specific APT and automated APT sample preparation by FIB have allowed increased APT sample volume. In the workflow of APT sampling, it is very critical to control depth of the sample where exact region of interest (ROI) for accurate APT analysis. Very precise depth control is required at low kV cleaning process in order to remove the damaged layer by previous high kV FIB process steps. We found low kV cleaning process with 5 kV and followed by 2kV beam conditions delivers better control to reached exact ROI on Z direction. This understanding is key to make APT sample with fully automated fashion.


2018 ◽  
Vol 194 ◽  
pp. 89-99 ◽  
Author(s):  
D.K. Schreiber ◽  
D.E. Perea ◽  
J.V. Ryan ◽  
J.E. Evans ◽  
J.D. Vienna

2020 ◽  
Author(s):  
Renelle Dubosq ◽  
Anna Rogowitz ◽  
Kevin Schweinar ◽  
Baptiste Gault ◽  
David Schneider

<p>In recent years, increasing developments in microscopy and microanalysis have allowed for the direct observation of nanoscale crystalline defects (i.e. dislocations). These defects are particularly important in naturally deformed materials yet this avenue of research remains understudied within the Earth Sciences. Dislocations can now be documented through the use of new and innovative structural and chemical analytical techniques such as electron channeling contrast imaging (ECCI), transmission electron microscopy, and atom probe tomography (APT). The presence and migration of dislocations in crystalline materials, including their role in trace element mobility, play a vital function in the way these materials respond to an applied stress. However, the mechanisms by which dislocations nucleate in minerals remain poorly understood. Prevailing models for dislocation nucleation include generation by Frank-Read sources, stress localization at crack-tips, atomic segregation, and free surface nucleation by critical stress-gradient criterion. Based on recent APT data from naturally-deformed pyrite, combined with electron backscatter diffraction (EBSD) mapping and ECC imaging, we propose a new nucleation mechanism where dislocations are generated by the local stress field in the vicinity of fluid inclusions. The investigated sample consists of a polycrystalline pyrite aggregate within a black shale host rock that has witnessed a peak temperature of 300°C. The combined EBSD and ECCI results reveal crystal plasticity in the form of lattice misorientation up to 8.5° and low-angle grain boundary development. APT data reveals nanoscale fluid inclusions enriched in As, O (H<sub>2</sub>O), Na and K as well as As- and Co-rich dislocations linked by fluid inclusions. This new model is the first documentation with APT methods of fluid inclusions (voids) in minerals, nanoscale features that are commonly misinterpreted as element clusters or chemically-enriched crystal-defects. The combined data has significant trans-disciplinary implications to the geosciences (structural geology, geochemistry, economic geology, geochronology), the material sciences (metals, ceramics, polymers), and analytical microscopy. Within geochronology voids and dislocations such as these in dated minerals may host elements or isotopes that negatively affect their age. Within ore deposit geology, voids in precious metal-hosting minerals may act as the necessary traps to structurally prevent the metals (gold, silver, copper) from migrating or diffusing out of the host mineral. In material sciences, the presence of such crystalline features can either limit or enhance the performance of engineering materials. Thus, performing APT analysis on crystalline material can help us better understand and predict their physical properties.</p>


2013 ◽  
Vol 132 ◽  
pp. 65-69 ◽  
Author(s):  
Ajay Kumar Kambham ◽  
Arul Kumar ◽  
Matthieu Gilbert ◽  
Wilfried Vandervorst

2007 ◽  
Vol 394 (2) ◽  
pp. 267-269 ◽  
Author(s):  
J.M. Cairney ◽  
D.W. Saxey ◽  
D. McGrouther ◽  
S.P. Ringer

2019 ◽  
Vol 25 (S2) ◽  
pp. 2522-2523
Author(s):  
Andrew J Breen ◽  
Yujiao Li ◽  
Leigh Stephenson ◽  
Baptiste Gault ◽  
Michael Herbig

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