Lifetime measurement of a particular deep crack failure on a flat-type divertor mockup under cyclic high heat flux loading conditions

2021 ◽  
Author(s):  
Shenghong Huang ◽  
Zhiwei Pan ◽  
Menglai Jiang ◽  
Kai Zhao ◽  
Yong Su

Abstract Plasma facing components (PFCs) are key to enduring high heat flux (HHF) loading from high-temperature plasma in nuclear fusion reactors. Understanding their thermal-mechanical behavior and cracking failure mechanisms related to structural designs and fabrication technologies during high heat flux loading is of great significance for improving their servicing performance and R&D (Research and Development) levels. In this study, a particular deep cracking failure process on the tungsten layer of a flat-type divertor mockup during 1800 cycles of 10 MW m-2 HHF loadings is completely monitored and measured with a special improved digital image correlation (DIC) technique. It is found that the DIC measurement under the HHF loading environment is improved successfully to capture fine deformation and strain fields with a spatial resolution less than 0.35 mm so that field strain on a 1 mm thick copper interlayer and deep crack initiation at several microns scale on the tungsten layer are measured out. Based on both full field and local strain and displacement measurements of the target divertor mockup, the thermal mechanical behaviors from deformation to crack initiation and propagation are successfully measured and traced. It is revealed that for the baseline copper interlayer design of a flat-type divertor mockup, the accumulation of plastic strain in the copper interlayer during ratcheting damage induces enough tensile stress on the tungsten layer during HHF cycles, leading to cracking and fracture failures even in its elastic state earlier than the copper LCF lifetime. Current SDC-IC rules fail to cover this kind of ratcheting cracking failure mode in the design stage. New design models or mechanical validation rules to resolve this design blind spot should be established in the future.

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Author(s):  
Tomio Okawa ◽  
Junki Ohashi ◽  
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