The Structure and Characterization of a Closterovirus, Beet Yellows Virus, and a Luteovirus, Beet Mild Yellowing Virus, by Scanning Transmission Electron Microscopy, Optical Diffraction of Electron Images and Acrylamide Gel Electrophoresis

Gel Electrophoresis ◽

Optical Diffraction ◽

Transmission Electron ◽

Beet Yellows Virus ◽

Scanning Transmission ◽

Yellowing Virus

Native mitochondrial creatine kinase forms octameric structures. II. Characterization of dimers and octamers by ultracentrifugation, direct mass measurements by scanning transmission electron microscopy, and image analysis of single mitochondrial creatine kinase octamers.

Journal of Biological Chemistry ◽

10.1016/s0021-9258(18)37483-0 ◽

1988 ◽

Vol 263 (32) ◽

pp. 16954-16962 ◽

Cited By ~ 8

Author(s):

T Schnyder ◽

A Engel ◽

A Lustig ◽

T Wallimann

Keyword(s):

Electron Microscopy ◽

Image Analysis ◽

Creatine Kinase ◽

Mitochondrial Creatine Kinase ◽

Mass Measurements ◽

Transmission Electron ◽

Characterization of core/shell bi-metallic cube-shaped nanoparticles with scanning transmission electron microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927615006133 ◽

2015 ◽

Vol 21 (S3) ◽

pp. 1069-1070

Author(s):

Dalaver H. Anjum ◽

Akshaya Samal ◽

Manuel A. Roldan-Gutierrez

Keyword(s):

Electron Microscopy ◽

Core Shell ◽

Shaped Nanoparticles ◽

Transmission Electron ◽

Atomic Characterization of Byproduct Nanoparticles on Cesium Lead Halide Nanocrystals Using High-Resolution Scanning Transmission Electron Microscopy

Crystals ◽

10.3390/cryst8010002 ◽

2017 ◽

Vol 8 (1) ◽

pp. 2 ◽

Cited By ~ 12

Author(s):

Mian Zhang ◽

Hongbo Li ◽

Qiang Jing ◽

Zhenda Lu ◽

Peng Wang

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Transmission Electron ◽

Scanning Transmission ◽

Lead Halide

Characterization of a Layered Lithium Manganese-rich Oxide Cathode Material via Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927614004218 ◽

2014 ◽

Vol 20 (S3) ◽

pp. 498-499 ◽

Cited By ~ 2

Author(s):

Aaron C. Johnston-Peck ◽

Leonid A. Bendersky ◽

Andrew A. Herzing

Keyword(s):

Electron Microscopy ◽

Cathode Material ◽

Oxide Cathode ◽

Lithium Manganese ◽

Transmission Electron ◽

Microstructural and compositional characterization of a new silicon carbide nanocables using scanning transmission electron microscopy

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/s1386-9477(02)00444-7 ◽

2002 ◽

Vol 15 (1) ◽

pp. 1-5 ◽

Cited By ~ 13

Author(s):

D.P Yu ◽

Y.J Xing ◽

M Tence ◽

H.Y Pan ◽

Y Leprince-Wang

Keyword(s):

Electron Microscopy ◽

Silicon Carbide ◽

Transmission Electron ◽

Scanning Transmission ◽

Compositional Characterization

Characterization of paired helical filaments by scanning transmission electron microscopy

Microscopy Research and Technique ◽

10.1002/jemt.20188 ◽

2005 ◽

Vol 67 (3-4) ◽

pp. 126-140 ◽

Cited By ~ 27

Author(s):

Hanna Ksiezak-Reding ◽

Joseph S. Wall

Keyword(s):

Electron Microscopy ◽

Paired Helical Filaments ◽

Transmission Electron ◽

Scanning Transmission Electron Microscopy Characterization of Nanostructured Palladium Film Formed by Dealloying with Citric Acid from Al–N–Pd Mother Alloy Film

MATERIALS TRANSACTIONS ◽

10.2320/matertrans.mbw201808 ◽

2019 ◽

Vol 60 (4) ◽

pp. 525-530 ◽

Cited By ~ 1

Author(s):

Takuji Ube ◽

Akizumi Kawamoto ◽

Takashi Ishiguro

Keyword(s):

Electron Microscopy ◽

Citric Acid ◽

Alloy Film ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Scanning Transmission ◽

Microscopy Characterization

Comprehensive Structural Characterization of Commercial Blue Light Emitting Diode by Using High-Angle Annular Dark Filed Scanning Transmission Electron Microscopy and Transmission Electron Microscopy

Korean Journal of Materials Research ◽

10.3740/mrsk.2015.25.1.1 ◽

2015 ◽

Vol 25 (1) ◽

pp. 1-8

Author(s):

Dong-Yeob Kim ◽

Soon-Ku Hong ◽

Tae-Hoon Chung ◽

Sang Hern Lee ◽

Jong Hyeob Baek

Keyword(s):

Electron Microscopy ◽

Structural Characterization ◽

Light Emitting Diode ◽

High Angle ◽

Light Emitting ◽

Transmission Electron ◽

Characterization of Grain Boundaries by Scanning Transmission Electron Microscopy.

Materia Japan ◽

10.2320/materia.37.938 ◽

1998 ◽

Vol 37 (11) ◽

pp. 938-944

Author(s):

Kenji Kaneko ◽

Sadahiro Tsurekawa ◽

Isao Tanaka

Keyword(s):

Electron Microscopy ◽

Grain Boundaries ◽

Transmission Electron ◽

Atomic-Scale Characterization of Metals and Alloys Using Spherical-Aberration Corrected Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927606065238 ◽

2006 ◽

Vol 12 (S02) ◽

pp. 1344-1345

Author(s):

D Williams ◽

M Watanabe

Keyword(s):

Electron Microscopy ◽

Spherical Aberration ◽

Atomic Scale ◽

Transmission Electron ◽

Scanning Transmission ◽

Scale Characterization ◽

Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006