Point defects in pure amorphous silicon and their role in structural relaxation: A tight-binding molecular-dynamics study
Keyword(s):
1997 ◽
Vol 55
(21)
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pp. 14279-14289
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Keyword(s):
2002 ◽
Vol 14
(41)
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pp. 9535-9553
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2004 ◽
Vol 43
(12)
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pp. 7966-7970
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Keyword(s):
1996 ◽
Vol 37
(1-3)
◽
pp. 189-192
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