Complex conductivity reconstruction in multiple frequency electrical impedance tomography for fabric-based pressure sensor
Purpose – The aim of this paper is to introduce and to evaluate the performance of a multiple frequency complex impedance reconstruction for fabric-based EIT pressure sensor. Pressure mapping is an important and challenging area of modern sensing technology. It has many applications in areas such as artificial skins in Robotics and pressure monitoring on soft tissue in biomechanics. Fabric-based sensors are being developed in conjunction with electrical impedance tomography (EIT) for pressure mapping imaging. This is potentially a very cost-effective pressure mapping imaging solution in particular for imaging large areas. Fabric-based EIT pressure sensors aim to provide a pressure mapping image using current carrying and voltage sensing electrodes attached on the boundary of the fabric patch. Design/methodology/approach – Recently, promising results are being achieved in conductivity imaging for these sensors. However, the fabric structure presents capacitive behaviour that could also be exploited for pressure mapping imaging. Complex impedance reconstructions with multiple frequencies are implemented to observe both conductivity and permittivity changes due to the pressure applied to the fabric sensor. Findings – Experimental studies on detecting changes of complex impedance on fabric-based sensor are performed. First, electrical impedance spectroscopy on a fabric-based sensor is performed. Secondly, the complex impedance tomography is carried out on fabric and compared with traditional EIT tank phantoms. Quantitative image quality measures are used to evaluate the performance of a fabric-based sensor at various frequencies and against the tank phantom. Originality/value – The paper demonstrates for the first time the useful information on pressure mapping imaging from the permittivity component of fabric EIT. Multiple frequency EIT reconstruction reveals spectral behaviour of the fabric-based EIT, which opens up new opportunities in exploration of these sensors.