Parallel testing for pattern-sensitive faults in semiconductor random-access memories
1981 ◽
Vol C-30
(12)
◽
pp. 973-977
◽
1980 ◽
Vol C-29
(6)
◽
pp. 419-429
◽
Keyword(s):
1988 ◽
Vol 23
(4)
◽
pp. 933-941
◽
2003 ◽
Vol 34
(1)
◽
pp. 3-21
◽
1975 ◽
Vol C-24
(2)
◽
pp. 150-157
◽