Parallel testing for pattern-sensitive faults in semiconductor random-access memories

1989 ◽  
Vol 38 (3) ◽  
pp. 394-407 ◽  
Author(s):  
P. Mazumder ◽  
J.H. Patel
2003 ◽  
Vol 34 (1) ◽  
pp. 3-21 ◽  
Author(s):  
F. Karimi ◽  
S. Irrinki ◽  
T. Crosby ◽  
N. Park ◽  
F. Lombardi

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