Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beam etching

1997 ◽  
Vol 9 (9) ◽  
pp. 1193-1195 ◽  
Author(s):  
P. Dowd ◽  
L. Raddatz ◽  
Y. Sumaila ◽  
M. Asghari ◽  
I.H. White ◽  
...  
Author(s):  
D.T. Mathes ◽  
J. Guenter ◽  
B. Hawkins ◽  
B. Hawthorne ◽  
C. Johnson

Abstract AOC herein describes a collection of material degradation features observed in Vertical Cavity Surface Emitting Lasers (VCSELs) that have been intentionally degraded with a range of electrostatic discharge (ESD) stress conditions. Failure analysis techniques employed include emission microscopy, Focused Ion Beam (FIB) microscopy and Transmission Electron Microscopy (TEM). The results have enabled higher confidence in root-cause determination for failed VCSEL devices.


1997 ◽  
Vol 484 ◽  
Author(s):  
Min Soo Park ◽  
Byung Tae Ahn ◽  
Hye Yong Chu ◽  
Byueng-Su Yoo ◽  
Hyo-Hoon Park

AbstractWe have studied the effect of geometric factors on the polarization properties of verticalcavity surface-emitting lasers with tilted pillar structures. Laser pillars with circular, square, diamond, and rectangular shapes were formed using reactive ion beam etching, by tilting the substrate with an angle of 15° ∼ 30° toward the [110] or [110] direction. We measured the polarization characteristics for the devices of 10 ∼ 20 atm size. We observed that an effective geometric factor on the polarization selectivity in tilted pillar structures is an asymmetric shape of vertical-cavity rather than an anisotropic shape of device area in planar direction.


2011 ◽  
Vol 47 (10) ◽  
pp. 1291-1296 ◽  
Author(s):  
Tomasz Czyszanowski ◽  
Maciej Dems ◽  
Robert P. Sarzala ◽  
Wlodzimierz Nakwaski ◽  
Krassimir Panajotov

2021 ◽  
Vol 58 (7) ◽  
pp. 0700008
Author(s):  
王翔媛 Wang Xiangyuan ◽  
崔碧峰 Cui Bifeng ◽  
李彩芳 Li Caifang ◽  
许建荣 Xu Jianrong ◽  
王豪杰 Wang Haojie

2015 ◽  
Author(s):  
Nikolay N. Ledentsov ◽  
Jörg-R. Kropp ◽  
Vitaly A. Shchukin ◽  
Gunther Steinle ◽  
Nikolay N. Ledentsov ◽  
...  

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