scholarly journals Adversarial Similarity Metric Learning for Kinship Verification

IEEE Access ◽  
2019 ◽  
Vol 7 ◽  
pp. 100029-100035
Author(s):  
Zeqiang Wei ◽  
Min Xu ◽  
Lin Geng ◽  
Haoming Liu ◽  
Hua Yin
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