Nuclear pumped Ar-Xe laser parameter measurements using 2 MeV proton beam excitation

Author(s):  
V.N. Kononov ◽  
M.V. Bokhovko ◽  
P.P. Dyachenko ◽  
V.N. Smolskly
1983 ◽  
Vol 54 (9) ◽  
pp. 4806-4820 ◽  
Author(s):  
L. G. Wiley ◽  
D. A. Hammer

Author(s):  
James W. Wetzel ◽  
Emrah Tiras ◽  
Burak Bilki ◽  
Ohannes Koseyan ◽  
Nilay Bostan ◽  
...  

Author(s):  
L. E. Thomas ◽  
J. S. Lally ◽  
R. M. Fisher

In addition to improved penetration at high voltage, the characteristics of HVEM images of crystalline materials are changed markedly as a result of many-beam excitation effects. This leads to changes in optimum imaging conditions for dislocations, planar faults, precipitates and other features.Resolution - Because of longer focal lengths and correspondingly larger aberrations, the usual instrument resolution parameter, CS174 λ 374 changes by only a factor of 2 from 100 kV to 1 MV. Since 90% of this change occurs below 500 kV any improvement in “classical” resolution in the MVEM is insignificant. However, as is widely recognized, an improvement in resolution for “thick” specimens (i.e. more than 1000 Å) due to reduced chromatic aberration is very large.


2006 ◽  
Vol 133 ◽  
pp. 549-551 ◽  
Author(s):  
S. Kawata ◽  
R. Sonobe ◽  
S. Miyazaki ◽  
K. Sakai ◽  
T. Kikuchi

2016 ◽  
Vol 228 (06/07) ◽  
Author(s):  
A Rashidi ◽  
S Barcikovski ◽  
S Jendrzej ◽  
S Tippelt ◽  
G Fleischhack ◽  
...  

2019 ◽  
Author(s):  
Gustavo Rangel ◽  
Mostafa Shahein ◽  
Thiago Felicio ◽  
Guilhermo Malave ◽  
Nyall London ◽  
...  

Skull Base ◽  
2008 ◽  
Vol 18 (S 01) ◽  
Author(s):  
Annie Chan ◽  
Paul Busse ◽  
Urmila Kamat ◽  
Derrick Lin ◽  
Norbert Liebsch

Skull Base ◽  
2009 ◽  
Vol 19 (03) ◽  
Author(s):  
Stacey Gray ◽  
William Curry ◽  
Annie Chan ◽  
Fred Barker ◽  
Daniel Deschler ◽  
...  

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