Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells

2012 ◽  
Author(s):  
Valentina Bonfiglio ◽  
Giuseppe Iannaccone
Keyword(s):  
Threshold Voltage ◽  
Flash Memory ◽  
Memory Cells

Correction to “Edge Profile Effect of Tunnel Oxide on Erase Threshold Voltage Distributions in Flash Memory Cells”

2007 ◽  
Vol 54 (4) ◽  
pp. 893-893
Author(s):  
Bomsoo Kim ◽  
Wook-Hyun Kwon ◽  
Chang-Ki Baek ◽  
Younghwan Son ◽  
Chan-Kwang Park ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Flash Memory ◽  
Memory Cells ◽  
Edge Profile ◽  
Voltage Distributions

scholarly journals Edge Profile Effect of Tunnel Oxide on Erase Threshold-Voltage Distributions in Flash Memory Cells

2006 ◽  
Vol 53 (12) ◽  
pp. 3012-3019 ◽  
Author(s):  
Bomsoo Kim ◽  
Wook-Hyun Kwon ◽  
Chang-Ki Baek ◽  
Younghwan Son ◽  
Chan-Kwang Park ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Flash Memory ◽  
Memory Cells ◽  
Edge Profile ◽  
Voltage Distributions

Random telegraph noise on the threshold voltage of multi-level flash memory

2017 ◽  
Vol 26 (1) ◽  
pp. 018502 ◽  
Author(s):  
Yiming Liao ◽  
Xiaoli Ji ◽  
Yue Xu ◽  
Chengxu Zhang ◽  
Qiang Guo ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Flash Memory ◽  
Random Telegraph Noise ◽  
Telegraph Noise ◽  
Multi Level

Fluorine Effects Originating From the CVD-W Process on Charge-Trap Flash Memory Cells

2019 ◽  
Vol 66 (1) ◽  
pp. 378-382 ◽  
Author(s):  
Jungmin Moon ◽  
Tae Yoon Lee ◽  
Hyun Jun Ahn ◽  
Tae In Lee ◽  
Wan Sik Hwang ◽  
...  
Keyword(s):  
Flash Memory ◽  
Memory Cells ◽  
Charge Trap
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