A three layers multiple kernel learning model for analog circuit fault diagnosis

2017 ◽  
Author(s):  
Zhang Wei ◽  
Xu Aiqiang ◽  
Ping Dianfa
Keyword(s):  
Fault Diagnosis ◽  
Analog Circuit ◽  
Multiple Kernel Learning ◽  
Learning Model ◽  
Kernel Learning ◽  
Multiple Kernel ◽  
Circuit Fault Diagnosis

An Analog Circuit Fault Diagnosis Approach Based on Wavelet-based fractal analysis and Multiple Kernel SVM

2020 ◽  
Vol 13 ◽  
Author(s):  
Jianfeng Jiang
Keyword(s):  
Fault Diagnosis ◽  
Fractal Analysis ◽  
Analog Circuit ◽  
Training Data ◽  
Support Vector ◽  
Pass Filter ◽  
Multiple Kernel ◽  
Testing Data ◽  
Circuit Fault Diagnosis ◽  
Diagnosis Approach

Objective: In order to diagnose the analog circuit fault correctly, an analog circuit fault diagnosis approach on basis of wavelet-based fractal analysis and multiple kernel support vector machine (MKSVM) is presented in the paper. Methods: Time responses of the circuit under different faults are measured, and then wavelet-based fractal analysis is used to process the collected time responses for the purpose of generating features for the signals. Kernel principal component analysis (KPCA) is applied to reduce the features’ dimensionality. Afterwards, features are divided into training data and testing data. MKSVM with its multiple parameters optimized by chaos particle swarm optimization (CPSO) algorithm is utilized to construct an analog circuit fault diagnosis model based on the testing data. Results: The proposed analog diagnosis approach is revealed by a four opamp biquad high-pass filter fault diagnosis simulation. Conclusion: The approach outperforms other commonly used methods in the comparisons.

scholarly journals Multiple Kernel Learning Model for Relating Structural and Functional Connectivity in the Brain

2018 ◽  
Vol 8 (1) ◽  
Author(s):  
Sriniwas Govinda Surampudi ◽  
Shruti Naik ◽  
Raju Bapi Surampudi ◽  
Viktor K. Jirsa ◽  
Avinash Sharma ◽  
...  
Keyword(s):  
Functional Connectivity ◽  
Multiple Kernel Learning ◽  
Learning Model ◽  
Kernel Learning ◽  
Multiple Kernel ◽  
The Brain

Robust Subspace Clustering Based on Automatic Weighted Multiple Kernel Learning

2021 ◽  
Author(s):  
Guo ◽  
Xiaoqian Zhang ◽  
Zhigui Liu ◽  
Xuqian Xue ◽  
Qian Wang ◽  
...  
Keyword(s):  
Multiple Kernel Learning ◽  
Subspace Clustering ◽  
Kernel Learning ◽  
Multiple Kernel

scholarly journals Analog Circuit Fault Diagnosis Based on Support Vector Machine Classifier and Fuzzy Feature Selection

Electronics ◽  
2021 ◽  
Vol 10 (12) ◽  
pp. 1496
Author(s):  
Hao Liang ◽  
Yiman Zhu ◽  
Dongyang Zhang ◽  
Le Chang ◽  
Yuming Lu ◽  
...  
Keyword(s):  
Support Vector Machine ◽  
Fault Diagnosis ◽  
Mutual Information ◽  
Analog Circuit ◽  
Fault Classification ◽  
Support Vector ◽  
Svm Classifier ◽  
Fault Parameters ◽  
Diagnosis Method ◽  
Circuit Fault Diagnosis

In analog circuit, the component parameters have tolerances and the fault component parameters present a wide distribution, which brings obstacle to classification diagnosis. To tackle this problem, this article proposes a soft fault diagnosis method combining the improved barnacles mating optimizer(BMO) algorithm with the support vector machine (SVM) classifier, which can achieve the minimum redundancy and maximum relevance for feature dimension reduction with fuzzy mutual information. To be concrete, first, the improved barnacles mating optimizer algorithm is used to optimize the parameters for learning and classification. We adopt six test functions that are on three data sets from the University of California, Irvine (UCI) machine learning repository to test the performance of SVM classifier with five different optimization algorithms. The results show that the SVM classifier combined with the improved barnacles mating optimizer algorithm is characterized with high accuracy in classification. Second, fuzzy mutual information, enhanced minimum redundancy, and maximum relevance principle are applied to reduce the dimension of the feature vector. Finally, a circuit experiment is carried out to verify that the proposed method can achieve fault classification effectively when the fault parameters are both fixed and distributed. The accuracy of the proposed fault diagnosis method is 92.9% when the fault parameters are distributed, which is 1.8% higher than other classifiers on average. When the fault parameters are fixed, the accuracy rate is 99.07%, which is 0.7% higher than other classifiers on average.

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