Residual stress measurement of the ground wafer by stepwise corrosion and Raman Spectroscopy

2015 16th International Conference on Electronic Packaging Technology (ICEPT) ◽

10.1109/icept.2015.7236723 ◽

2015 ◽

Author(s):

Jinglong Sun ◽

Fei Qin ◽

Chao Ren ◽

Zhongkang Wang ◽

Tang Liang

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Stress Measurement ◽

Residual Stress Measurement

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Residual stress measurement of the ground wafer by Raman spectroscopy

2014 15th International Conference on Electronic Packaging Technology ◽

10.1109/icept.2014.6922785 ◽

2014 ◽

Author(s):

Sun Jinglong ◽

Qin Fei ◽

Ren Chao ◽

Wang Zhongkang ◽

Tang Liang

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Stress Measurement ◽

Residual Stress Measurement

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Residual stress measurement in a metal microdevice by micro Raman spectroscopy

Journal of Micromechanics and Microengineering ◽

10.1088/1361-6439/aa8912 ◽

2017 ◽

Vol 27 (10) ◽

pp. 105014 ◽

Author(s):

Chang Song ◽

Liqun Du ◽

Leijie Qi ◽

Yu Li ◽

Xiaojun Li ◽

...

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Micro Raman Spectroscopy

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Effects of piezo-spectroscopic coefficients of 8wt.% Y2O3 stabilized ZrO2 on residual stress measurement of thermal barrier coatings by Raman spectroscopy

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2010.04.024 ◽

2010 ◽

Vol 204 (21-22) ◽

pp. 3573-3577 ◽

Author(s):

W.G. Mao ◽

Q. Chen ◽

C.Y. Dai ◽

L. Yang ◽

Y.C. Zhou ◽

...

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Thermal Barrier Coatings ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Thermal Barrier ◽

Barrier Coatings

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Raman spectroscopy assisted residual stress measurement of plasma sprayed and laser remelted zirconia splats and coatings

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2019.124920 ◽

2019 ◽

Vol 378 ◽

pp. 124920 ◽

Author(s):

Biswajit Das ◽

Pierre Brodard ◽

P.P. Bandyopadhyay

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Stress Measurement ◽

Residual Stress Measurement ◽

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Residual stress measurement of an EB-PVD Y2O3-ZrO2 thermal barrier coating by micro-Raman spectroscopy

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2009.08.042 ◽

2009 ◽

Vol 204 (5) ◽

pp. 657-660 ◽

Author(s):

M. Tanaka ◽

R. Kitazawa ◽

T. Tomimatsu ◽

Y.F. Liu ◽

Y. Kagawa

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Thermal Barrier Coating ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Thermal Barrier ◽

Micro Raman Spectroscopy ◽

Barrier Coating

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Residual Stress Measurement in Si-based Multilayer Structure by Micro-Raman Spectroscopy

Optics ◽

10.11648/j.optics.s.2015040301.18 ◽

2015 ◽

Vol 4 (3) ◽

pp. 33

Author(s):

Wei Qiu

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Multilayer Structure ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Micro Raman Spectroscopy

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Residual stress measurement of Sic fiber/YSZ composite thermal barrier coating by micro-Raman spectroscopy

IOP Conference Series Materials Science and Engineering ◽

10.1088/1757-899x/397/1/012019 ◽

2018 ◽

Vol 397 ◽

pp. 012019 ◽

Author(s):

Rongbin Ma ◽

Ziyi Tan ◽

Genglei Kang

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Thermal Barrier Coating ◽

Stress Measurement ◽

Residual Stress Measurement ◽

Thermal Barrier ◽

Micro Raman Spectroscopy ◽

Sic Fiber ◽

Barrier Coating

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Residual stress measurement of the ground wafer by Raman spectroscopy

2014 Joint IEEE International Symposium on the Applications of Ferroelectric, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy ◽

10.1109/isaf.2014.6917994 ◽

2014 ◽

Author(s):

Sun Jinglong ◽

Qin Fei ◽

Ren Chao ◽

Wang Zhongkang ◽

Tang Liang

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Stress Measurement ◽

Residual Stress Measurement

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Accurate residual stress measurement as a function of depth in environmental barrier coatings via a combination of X-ray diffraction and Raman spectroscopy

Ceramics International ◽

10.1016/j.ceramint.2020.02.025 ◽

2020 ◽

Vol 46 (8) ◽

pp. 12613-12617 ◽

Author(s):

Cheng Ye ◽

Peng Jiang

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Stress Measurement ◽

Residual Stress Measurement ◽

X Ray Diffraction ◽

Barrier Coatings ◽

Environmental Barrier Coatings ◽

X Ray ◽

Environmental Barrier

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Residual stress measurement in thin carbon films by Raman spectroscopy and nanoindentation

Thin Solid Films ◽

10.1016/s0040-6090(03)00276-1 ◽

2003 ◽

Vol 429 (1-2) ◽

pp. 190-200 ◽

Author(s):

Craig A Taylor ◽

Mark F Wayne ◽

Wilson K.S Chiu

Keyword(s):

Residual Stress ◽

Raman Spectroscopy ◽

Stress Measurement ◽

Carbon Films ◽

Residual Stress Measurement ◽

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