Hot Carrier Stress Investigation of Zinc Oxide Thin Film Transistors with an Al2O3 Gate Dielectric
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2012 ◽
Vol 159
(3)
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pp. H286-H289
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2011 ◽
Vol 26
(9)
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pp. 095004
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2010 ◽
Vol 18
(8)
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pp. 552
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2013 ◽
Vol 52
(7R)
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pp. 071102
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2014 ◽
Vol 211
(9)
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pp. 2126-2133
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