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2002 ◽  
Author(s):  
J.F. Conley ◽  
P.M. Lenahan ◽  
B.D. Wallace
Keyword(s):  
Predictive Model ◽  
Gate Oxides ◽  
Physically Based

Predicting radiation response from process parameters: Verification of a physically based predictive model

1999 ◽  
Vol 46 (6) ◽  
pp. 1534-1543 ◽  
Author(s):  
P.M. Lenahan ◽  
J.J. Mele ◽  
J.F. Conley ◽  
R.K. Lowry ◽  
D. Woodbury
Keyword(s):  
Predictive Model ◽  
Process Parameters ◽  
Radiation Response ◽  
Physically Based

Physically Based Predictive Model for Single Event Transients in CMOS Gates

2016 ◽  
Vol 63 (6) ◽  
pp. 2248-2254 ◽  
Author(s):  
Mehdi Saremi ◽  
Aymeric Privat ◽  
Hugh J. Barnaby ◽  
Lawrence T. Clark
Keyword(s):  
Predictive Model ◽  
Single Event ◽  
Single Event Transients ◽  
Physically Based
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