Computerized Solution Verification Systems Applied for On-Line Programming Training

Author(s):  
Dmitry V. Luchaninov ◽  
Ruslan I. Bazhenov ◽  
Oksana V. Dudareva ◽  
Natalya A. Chalkina ◽  
Yurii V. Sosnovskii
2021 ◽  
Vol 16 (91) ◽  
pp. 14-21
Author(s):  
Olga V. Ratanova ◽  

The article discusses the issues of automated teaching of programming. Programming is one of the fastest growing and promising industries in the modern world. Based on information from recruitment agencies, there is now a shortage of highly specialized programmers, and it will only increase. Currently, employers have increased requirements for the qualification of programmers. Therefore, teaching programming in courses or advanced training of programmers is especially relevant. Automation makes learning more affordable. The role of automated learning on-line is increasing at this time. The article analyzes the principles of construction and typical elements of existing training courses. And it also analyzes methods of increasing the efficiency automated learning that can be done online. Creating circumstances under which the student received the necessary practical skills is an actual issue with such training. These are the skills of writing and debugging correct code in a programming language in the absence or with minimal presence of a teacher. Checking the code by the teacher, searching for errors and identifying inefficient code is an important point in full-time programming training. At this point, the student receives quick feedback from the teacher. Training tasks should be created so that code validation can be performed automatically. The article suggests changes and additions that will increase the effectiveness of existing automated courses of teaching of programming. The analysis of existing software code verification systems was performed. And the verification methods that are applicable in training were identified. Automatic verification of program code can take learning to a new higher level.


MACRo 2015 ◽  
2017 ◽  
Vol 2 (1) ◽  
pp. 11-22 ◽  
Author(s):  
Margit Antal ◽  
András Bandi

AbstractThe widespread use of smartphones and the ability of these devices to digitize signatures have made it possible to sign electronic documents in this way. In this paper we compared two on-line signature databases in terms of verification performance: the MCYT containing signatures drawn by stylus pen, and MOBISIG containing finger drawn signatures. Performance evaluations were performed using both local and global systems. In the case of global systems, we evaluated the performance of a novel information theory features set. Little improvement was achieved by this feature set. There were large differences between the two databases in terms of performance. Finger drawn signatures collected by mobile device were proved inferior to signatures collected by digitizing tablet and its stylus.


2020 ◽  
Vol 8 (4) ◽  
pp. 902-914
Author(s):  
Alpana Deka ◽  
Lipi B Mahanta

In the field of security and forgery prevention, handwritten signatures are the most widely recognized biometric since long and also most practical. Although handwritten signature verification systems are studied using both On-line and Off-line approaches, Off-line signature verification systems are more difficult to compare to On-line verification systems. This is due to the lack of dynamic information, viz. a database which constantly stores the latest signature of the person.  In the paper an approach using ensemble methods are adopted to classify a signature as forgery or not. In proposed system, three classifiers, viz, one unsupervised, viz. Fuzzy C-Means (FCM) and two supervised classifiers, viz. Naive Bayes (NB) and Support Vector Machine (SVM) are used as base classifiers. An attempt is made to compare the different approaches. We attempt both the categories of classification not only because both of them are applicable in this particular case but also with an objective of finding out which performs better. In most cases it is observed that Naive Bayes and Ensemble are comparable as they exhibit better performance than the other two. But among them, in most of the cases Ensemble classifier performs better than the Naive Bayes and consequently we have taken the Ensemble as a final classifier.


Author(s):  
William Krakow

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.


Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.


Author(s):  
Neil Rowlands ◽  
Jeff Price ◽  
Michael Kersker ◽  
Seichi Suzuki ◽  
Steve Young ◽  
...  

Three-dimensional (3D) microstructure visualization on the electron microscope requires that the sample be tilted to different positions to collect a series of projections. This tilting should be performed rapidly for on-line stereo viewing and precisely for off-line tomographic reconstruction. Usually a projection series is collected using mechanical stage tilt alone. The stereo pairs must be viewed off-line and the 60 to 120 tomographic projections must be aligned with fiduciary markers or digital correlation methods. The delay in viewing stereo pairs and the alignment problems in tomographic reconstruction could be eliminated or improved by tilting the beam if such tilt could be accomplished without image translation.A microscope capable of beam tilt with simultaneous image shift to eliminate tilt-induced translation has been investigated for 3D imaging of thick (1 μm) biologic specimens. By tilting the beam above and through the specimen and bringing it back below the specimen, a brightfield image with a projection angle corresponding to the beam tilt angle can be recorded (Fig. 1a).


Author(s):  
G.Y. Fan ◽  
J.M. Cowley

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.


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