Dual-Tap Computational Photography Image Sensor With Per-Pixel Pipelined Digital Memory for Intra-Frame Coded Multi-Exposure

2019 ◽  
Vol 54 (11) ◽  
pp. 3191-3202 ◽  
Author(s):  
Navid Sarhangnejad ◽  
Harel Haim ◽  
Manuel Moreno-Garcia ◽  
David Stoppa ◽  
Kiriakos N. Kutulakos ◽  
...  
Keyword(s):  
Image Sensor ◽  
Computational Photography ◽  
Digital Memory

Development of Wafer Level Chip Size Packaging Process and its Application to the CMOS Image Sensor Module for Medical Device

2017 ◽  
Vol 137 (2) ◽  
pp. 48-58
Author(s):  
Noriyuki Fujimori ◽  
Takatoshi Igarashi ◽  
Takahiro Shimohata ◽  
Takuro Suyama ◽  
Kazuhiro Yoshida ◽  
...  
Keyword(s):  
Medical Device ◽  
Cmos Image Sensor ◽  
Image Sensor ◽  
Wafer Level ◽  
Packaging Process ◽  
Sensor Module ◽  
Chip Size

Current and Future 3D-LSI Technology for the Image Sensor Devices

2008 ◽  
Author(s):  
Makoto Motoyoshi ◽  
Hirofumi Nakamura ◽  
Manabu Bonkohara ◽  
Mitsumasa Koyanagi
Keyword(s):  
Image Sensor ◽  
Sensor Devices

An Over 120dB Dynamic Range Linear Response Single Exposure CMOS Image Sensor with Two-stage Lateral Overflow Integration Trench Capacitors

2020 ◽  
Vol 2020 (7) ◽  
pp. 143-1-143-6 ◽  
Author(s):  
Yasuyuki Fujihara ◽  
Maasa Murata ◽  
Shota Nakayama ◽  
Rihito Kuroda ◽  
Shigetoshi Sugawa
Keyword(s):  
Linear Response ◽  
Dynamic Range ◽  
Signal To Noise Ratio ◽  
Cmos Image Sensor ◽  
Image Sensor ◽  
Signal To Noise ◽  
Single Exposure ◽  
Two Stage ◽  
Noise Ratio ◽  
Maximum Signal

This paper presents a prototype linear response single exposure CMOS image sensor with two-stage lateral overflow integration trench capacitors (LOFITreCs) exhibiting over 120dB dynamic range with 11.4Me- full well capacity (FWC) and maximum signal-to-noise ratio (SNR) of 70dB. The measured SNR at all switching points were over 35dB thanks to the proposed two-stage LOFITreCs.

A practical approach on non-regular sampling and universal demosaicing of raw image sensor data

2020 ◽  
Vol 2020 (1) ◽  
pp. 91-95
Author(s):  
Philipp Backes ◽  
Jan Fröhlich
Keyword(s):  
Image Quality ◽  
Source Code ◽  
Image Sensor ◽  
Sensor Data ◽  
Color Filter ◽  
Lowpass Filter ◽  
Sampling Errors ◽  
Regular Sampling ◽  
Single Sensor ◽  
Similar Image Quality

Non-regular sampling is a well-known method to avoid aliasing in digital images. However, the vast majority of single sensor cameras use regular organized color filter arrays (CFAs), that require an optical-lowpass filter (OLPF) and sophisticated demosaicing algorithms to suppress sampling errors. In this paper a variety of non-regular sampling patterns are evaluated, and a new universal demosaicing algorithm based on the frequency selective reconstruction is presented. By simulating such sensors it is shown that images acquired with non-regular CFAs and no OLPF can lead to a similar image quality compared to their filtered and regular sampled counterparts. The MATLAB source code and results are available at: http://github. com/PhilippBackes/dFSR

Development of a Pixel of Area Image Sensor in X-ray Detector

2018 ◽  
Vol 23 (6) ◽  
pp. 573-585
Author(s):  
D.A. Suponnikov ◽  
◽  
A.N. Putilin ◽  
E.A. Tatarinova ◽  
Z.G. Zhgunev ◽  
...  
Keyword(s):  
Image Sensor ◽  
X Ray

Extending Electrical Scanning Probe Microscopy Measurements of Semiconductor Devices Using Microwave Impedance Microscopy

2015 ◽  
Author(s):  
Benedict Drevniok ◽  
St. John Dixon-Warren ◽  
Oskar Amster ◽  
Stuart L Friedman ◽  
Yongliang Yang
Keyword(s):  
Scanning Probe Microscopy ◽  
Semiconductor Devices ◽  
Cmos Image Sensor ◽  
Image Sensor ◽  
Scanning Probe ◽  
Cross Sectional ◽  
Probe Microscopy ◽  
Dopant Profiling ◽  
Capacitance Voltage

Abstract Scanning microwave impedance microscopy was used to analyze a CMOS image sensor sample to reveal details of the dopant profiling in planar and cross-sectional samples. Sitespecific capacitance-voltage spectroscopy was performed on different regions of the samples.

Deterministic Deployment for Wireless Image Sensor Nodes

2014 ◽  
Vol 8 (1) ◽  
pp. 668-674
Author(s):  
Junguo Zhang ◽  
Yutong Lei ◽  
Fantao Lin ◽  
Chen Chen
Keyword(s):  
Wireless Sensor Networks ◽  
Sensor Networks ◽  
Visual Information ◽  
Image Sensor ◽  
Sensor Nodes ◽  
Wireless Sensor ◽  
Coverage Area ◽  
Effective Coverage ◽  
Area Of Interest ◽  
Key Issues

Wireless sensor networks composed of camera enabled source nodes can provide visual information of an area of interest, potentially enriching monitoring applications. The node deployment is one of the key issues in the application of wireless sensor networks. In this paper, we take the effective coverage and connectivity as the evaluation indices to analyze the effect of the perceivable angle and the ratio of communication radius and sensing radius for the deterministic circular deployment. Experimental results demonstrate that the effective coverage area of the triangle deployment is the largest when using the same number of nodes. When the nodes are deployed in the same monitoring area in the premise of ensuring connectivity, rhombus deployment is optimal when √2 < rc / rs < √3 . The research results of this paper provide an important reference for the deployment of the image sensor networks with the given parameters.

A 10-bit ratio-independent cyclic ADC with offset canceling for a CMOS image sensor

2014 ◽  
Vol 35 (3) ◽  
pp. 035005 ◽  
Author(s):  
Kaiming Nie ◽  
Suying Yao ◽  
Jiangtao Xu ◽  
Zhaorui Jiang
Keyword(s):  
Cmos Image Sensor ◽  
Image Sensor ◽  
Cyclic Adc
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