Laser beam focusing through the scattering medium using 14-, 32- and 48-channel bimorph mirrors

Author(s):  
Ilya Galaktionov ◽  
Julia Sheldakova ◽  
Alexis Kudryashov ◽  
Alexander Nikitin
2017 ◽  
Author(s):  
Ilya Galaktionov ◽  
Alexis Kudryashov ◽  
Julia Sheldakova ◽  
Alexander Nikitin

2021 ◽  
Author(s):  
Ilya V. Galaktionov ◽  
Alexander Nikitin ◽  
Julia Sheldakova ◽  
Alexis Kudryashov

Author(s):  
Ilya Galaktionov ◽  
Alexis Kudryashov ◽  
Julia Sheldakova ◽  
Alexander Nikitin ◽  
Vadim Samarkin

Author(s):  
Alexis V. Kudryashov ◽  
Ilia Galaktionov ◽  
Alexander Nikitin ◽  
Vadim Samarkin ◽  
Julia Sheldakova

Author(s):  
Ilya Galaktionov ◽  
Julia Sheldakova ◽  
Vladimir Toporovsky ◽  
Vadim Samarkin ◽  
Alexis Kudryashov

2020 ◽  
Vol 28 (25) ◽  
pp. 38061
Author(s):  
Ilya Galaktionov ◽  
Julia Sheldakova ◽  
Alexander Nikitin ◽  
Vadim Samarkin ◽  
Vadim Parfenov ◽  
...  

Author(s):  
Frank S. Arnold

Abstract To be better prepared to use laser based failure isolation techniques on field failures of complex integrated circuits, simple test structures without any failures can be used to study Optical Beam Induced Resistance Change (OBIRCH) results. In this article, four case studies are presented on the following test structures: metal strap, contact string, VIA string, and comb test structure. Several experiments were done to investigate why an OBIRCH image was seen in certain areas of a VIA string and not in others. One experiment showed the OBRICH variation was not related to the cooling and heating effects of the topology, or laser beam focusing. A 4 point probe resistance measurement and cross-sectional views correlated with the OBIRCH results and proved OBIRCH was able to detect a variation in VIA fabrication.


2021 ◽  
Vol 1865 (2) ◽  
pp. 022004
Author(s):  
Chunyan Yang ◽  
Yun Hao ◽  
Yangping Li ◽  
Bozhe Wang ◽  
Hai Yuan ◽  
...  

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