Average energy to produce an ion pair in gases for high energy heavy ions

Author(s):  
S. Sasaki ◽  
T. Sanami ◽  
K. Saito ◽  
K. Iijima ◽  
H. Tawara ◽  
...  
1980 ◽  
Vol 82 (1) ◽  
pp. 1 ◽  
Author(s):  
Ralph H. Thomas ◽  
John T. Lyman ◽  
Theodore M. de Castro

2020 ◽  
pp. 8-12
Author(s):  
Alexandr V. Oborin ◽  
Anna Y. Villevalde ◽  
Sergey G. Trofimchuk

The results of development of the national primary standard of air kerma, air kerma rate, exposure, exposure rate and energy flux for X-rays and gamma radiation GET 8-2011 in 2019 are presented according to the recommendations of the ICRU Report No. 90 “Key Data for Ionizing-Radiation Dosimetry: Measurement Standards and Applications”. The following changes are made to the equations for the units determination with the standard: in the field of X-rays, new correction coefficients of the free-air ionization chambers are introduced and the relative standard uncertainty of the average energy to create an ion pair in air is changed; in the field of gamma radiation, the product of the average energy to create an ion pair in air and the electron stopping-power graphite to air ratio for the cavity ionization chambers is changed. More accurate values of the units reproduced by GET 8-2019 are obtained and new metrological characteristics of the standard are stated.


2013 ◽  
Vol 341 ◽  
pp. 181-210 ◽  
Author(s):  
S.K. Tripathi

High-energy electron, proton, neutron, photon and ion irradiation of semiconductor diodes and solar cells has long been a topic of considerable interest in the field of semiconductor device fabrication. The inevitable damage production during the process of irradiation is used to study and engineer the defects in semiconductors. In a strong radiation environment in space, the electrical performance of solar cells is degraded due to direct exposure to energetically charged particles. A considerable amount of work has been reported on the study of radiation damage in various solar cell materials and devices in the recent past. In most cases, high-energy heavy ions damage the material by producing a large amount of extended defects, but high-energy light ions are suitable for producing and modifying the intrinsic point defects. The defects can play a variety of electronically active roles that affect the electrical, structural and optical properties of a semiconductor. This review article aims to present an overview of the advancement of research in the modification of glassy semiconducting thin films using different types of radiations (light, proton and swift heavy ions). The work which has been done in our laboratory related to irradiation induced effects in semiconducting thin films will also be compared with the existing literature.


2007 ◽  
Vol 782 (1-4) ◽  
pp. 215-223 ◽  
Author(s):  
David d'Enterria
Keyword(s):  

Author(s):  
E. Dooryhee ◽  
Y. Langevin ◽  
J. Borg ◽  
J. P. Duraud ◽  
E. Balanzat

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