Total Ionizing dose and single event effects test results of a Radiation Hardness-by-Design Library for 0.15μm fully depleted SOI-AISC

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994729 ◽

2009 ◽

Author(s):

A. Makihara ◽

T. Ebihara ◽

T. Yokose ◽

Y. Tsuchiya ◽

Y. Miyazaki ◽

...

Keyword(s):

Radiation Hardness ◽

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Fully Depleted ◽

Single Event Effects

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NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906647 ◽

2019 ◽

Author(s):

Alvson D. Topper ◽

Edward J. Wyrwas ◽

Kaitlyn Ryder ◽

Kenneth A. LaBel ◽

Jonathan A. Pellish ◽

...

Keyword(s):

Space Flight ◽

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Displacement Damage ◽

Single Event Effects ◽

Damage Dose ◽

Nasa Goddard Space ◽

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Megarad total ionizing dose and single event effects test results of a radhard-by-design 0.25 micron ASIC [space applications]

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352914 ◽

2005 ◽

Author(s):

M. Hartwell ◽

C. Hafer ◽

P. Milliken ◽

T. Farris

Keyword(s):

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Space Applications ◽

Single Event Effects

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Single-Event Effects Test Results of the Intersil ISL73141SEH Precision SAR ADC

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) ◽

10.1109/redw51883.2020.9325849 ◽

2020 ◽

Author(s):

J. M. Harris ◽

L. G. Pearce ◽

N. W. van Vonno ◽

E. J. Thomson

Keyword(s):

Sar Adc ◽

Test Results ◽

Single Event ◽

Single Event Effects

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Compendium of Single Event Transient (SET) and Total Ionizing Dose (TID) Test Results for Commonly Used Voltage Comparators

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115430 ◽

2017 ◽

Author(s):

Amanda N. Bozovich ◽

Farokh Irom

Keyword(s):

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Single Event Transient

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Radiation hardness evaluations of 65 nm fully depleted silicon on insulator and bulk processes by measuring single event transient pulse widths and single event upset rates

Japanese Journal of Applied Physics ◽

10.7567/jjap.54.04dc15 ◽

2015 ◽

Vol 54 (4S) ◽

pp. 04DC15 ◽

Author(s):

Jun Furuta ◽

Eiji Sonezaki ◽

Kazutoshi Kobayashi

Keyword(s):

Radiation Hardness ◽

Silicon On Insulator ◽

Single Event Upset ◽

Single Event ◽

Single Event Transient ◽

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Total Ionizing Dose and Single Event Effects Hardness Assurance Qualification Issues for Microelectronics

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2008.2001268 ◽

2008 ◽

Vol 55 (4) ◽

pp. 1926-1946 ◽

Author(s):

Marty R. Shaneyfelt ◽

James R. Schwank ◽

Paul E. Dodd ◽

James A. Felix

Keyword(s):

Single Event ◽

Total Ionizing Dose ◽

Single Event Effects

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Total ionizing dose and single event effects of 1 Mb HfO2-based resistive-random-access memory

Microelectronics Reliability ◽

10.1016/j.microrel.2018.07.017 ◽

2018 ◽

Vol 88-90 ◽

pp. 891-897 ◽

Author(s):

Jinshun Bi ◽

Yuan Duan ◽

Kai Xi ◽

Bo Li

Keyword(s):

Random Access ◽

Random Access Memory ◽

Resistive Random Access Memory ◽

Single Event ◽

Total Ionizing Dose ◽

Access Memory ◽

Single Event Effects

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2017 Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory's Radiation Effects Group

2017 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/nsrec.2017.8115429 ◽

2017 ◽

Author(s):

Gregory R. Allen ◽

Sergeh Vartanian ◽

Farokh Irom ◽

Leif Z. Scheick ◽

Philippe Adell ◽

...

Keyword(s):

Radiation Effects ◽

Test Results ◽

Single Event ◽

Single Event Effects ◽

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Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731471 ◽

2002 ◽

Author(s):

S.H. Crain ◽

W.R. Crain ◽

K.B. Crawford ◽

S.J. Hansel ◽

P. Yu ◽

...

Keyword(s):

Digital Signal ◽

Digital Signal Processors ◽

Test Results ◽

Single Event ◽

Single Event Effects ◽

Signal Processors

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2015 Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory's Radiation Effects Group

2015 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2015.7336703 ◽

2015 ◽

Author(s):

Gregory R. Allen ◽

Leif Z. Scheick ◽

Farokh Irom ◽

Steven M. Guertin ◽

Philippe C. Adell ◽

...

Keyword(s):

Radiation Effects ◽

Test Results ◽

Single Event ◽

Single Event Effects ◽

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