Impact of Interface Trap Charges on Performance of Electrically Doped Tunnel FET With Heterogeneous Gate Dielectric
2017 ◽
Vol 17
(1)
◽
pp. 245-252
◽
2019 ◽
Vol 102
◽
pp. 1-8
◽
2017 ◽
Vol 64
(11)
◽
pp. 4731-4737
◽
2017 ◽
Vol 64
(4)
◽
pp. 1482-1488
◽