Effective amplification of microwaves in structures with field and secondary emission

2003 ◽  
Author(s):  
A. Galdetskiy
Keyword(s):  
Secondary Emission

S.E.M.-T.E.M. Image Comparison

1971 ◽  
Vol 29 ◽  
pp. 132-133
Author(s):  
G. M. Greene ◽  
J. W. Sprys
Keyword(s):  
Electron Microscope ◽  
Low Carbon Steel ◽  
Secondary Emission ◽  
Low Carbon ◽  
Preparation Time ◽  
Actual Surface ◽  
Fine Detail ◽  
Transmission Electron ◽  
Transmission Study ◽  
Large Sections

The present study demonstrates that fracture surfaces appear strikingly different when observed in the transmission electron microscope by replication and in the scanning electron microscope by backscattering and secondary emission. It is important to know what form these differences take because of the limitations of each instrument. Replication is useful for study of surfaces too large for insertion into the S.E.M. and for resolution of fine detail at high magnification with the T.E.M. Scanning microscopy reduces sample preparation time and allows large sections of the actual surface to be viewed.In the present investigation various modes of the S.E.M. along with the transmission mode in the T.E.M. were used to study one area of a fatigue surface of a low carbon steel. Following transmission study of a platinum carbon replica in the T.E.M. and S.E.M. the replica was coated with a gold layer approximately 200A° in thickness to improve electron emission.

Historical Introduction

1977 ◽  
Vol 35 ◽  
pp. 2-5
Author(s):  
R. D. Heidenreich
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
50Th Anniversary ◽  
Secondary Emission ◽  
Wave Nature ◽  
Nobel Prize In Physics ◽  
Primary Electrons ◽  
The U.S ◽  
Mutual Agreement

This program has been organized by the EMSA to commensurate the 50th anniversary of the experimental verification of the wave nature of the electron. Davisson and Germer in the U.S. and Thomson and Reid in Britian accomplished this at about the same time. Their findings were published in Nature in 1927 by mutual agreement since their independent efforts had led to the same conclusion at about the same time. In 1937 Davisson and Thomson shared the Nobel Prize in physics for demonstrating the wave nature of the electron deduced in 1924 by Louis de Broglie.The Davisson experiments (1921-1927) were concerned with the angular distribution of secondary electron emission from nickel surfaces produced by 150 volt primary electrons. The motivation was the effect of secondary emission on the characteristics of vacuum tubes but significant deviations from the results expected for a corpuscular electron led to a diffraction interpretation suggested by Elasser in 1925.

Analysis of Contrast Reversal in SEM Images

1972 ◽  
Vol 30 ◽  
pp. 398-399
Author(s):  
M. D. Coutts ◽  
E. R. Levin
Keyword(s):  
Incident Beam ◽  
Normal Incidence ◽  
Beam Current ◽  
Secondary Emission ◽  
Image Contrast ◽  
Sem Images ◽  
Secondary Electrons ◽  
Image Position

On tilting samples in an SEM, the image contrast between two elements, x and y often decreases to zero at θε, which we call the no-contrast angle. At angles above θε the contrast is reversed, θ being the angle between the specimen normal and the incident beam. The available contrast between two elements, x and y, in the SEM can be defined as,(1)where ix and iy are the total number of reflected and secondary electrons, leaving x and y respectively. It can easily be shown that for the element x,(2)where ib is the beam current, isp the specimen absorbed current, δo the secondary emission at normal incidence, k is a constant, and m the reflected electron coefficient.

The Potentials of Scanning Microscopy

1968 ◽  
Vol 26 ◽  
pp. 352-353
Author(s):  
A. V. Crewe
Keyword(s):  
Salient Feature ◽  
Secondary Emission ◽  
Resolving Power ◽  
X Rays ◽  
Scanning Microscope ◽  
Forming Process ◽  
Additional Tool ◽  
Detection Systems ◽  
Conventional Microscope ◽  
Present Information

If the resolving power of a scanning electron microscope can be improved until it is comparable to that of a conventional microscope, it would serve as a valuable additional tool in many investigations.The salient feature of scanning microscopes is that the image-forming process takes place before the electrons strike the specimen. This means that several different detection systems can be employed in order to present information about the specimen. In our own particular work we have concentrated on the use of energy loss information in the beam which is transmitted through the specimen, but there are also numerous other possibilities (such as secondary emission, generation of X-rays, and cathode luminescence).Another difference between the pictures one would obtain from the scanning microscope and those obtained from a conventional microscope is that the diffraction phenomena are totally different. The only diffraction phenomena which would be seen in the scanning microscope are those which exist in the beam itself, and not those produced by the specimen.

Scanning ion microscopy images

1987 ◽  
Vol 45 ◽  
pp. 180-181
Author(s):  
R. Levi-Setti ◽  
J.M. Chabala ◽  
Y.L. Wang
Keyword(s):  
Metal Ion ◽  
Secondary Emission ◽  
Scanning Method ◽  
Ion Channeling ◽  
Secondary Ions ◽  
High Resolution Images ◽  
Ion Microscopy ◽  
Z Contrast ◽  
Focused Beams ◽  
Microscopy Images

Finely focused beams extracted from liquid metal ion sources (LMIS) provide a wealth of secondary signals which can be exploited to create high resolution images by the scanning method. The images of scanning ion microscopy (SIM) encompass a variety of contrast mechanisms which we classify into two broad categories: a) Emission contrast and b) Analytical contrast.Emission contrast refers to those mechanisms inherent to the emission of secondaries by solids under ion bombardment. The contrast-carrying signals consist of ion-induced secondary electrons (ISE) and secondary ions (ISI). Both signals exhibit i) topographic emission contrast due to the existence of differential geometric emission and collection effects, ii) crystallographic emission contrast, due to primary ion channeling phenomena and differential oxidation of crystalline surfaces, iii) chemical emission or Z-contrast, related to the dependence of the secondary emission yields on the Z and surface chemical state of the target.

Inquiry into the Processes of Electron Beam Generation in a Magnetron Gun with Secondary-Emission Cathode

1999 ◽  
Vol 53 (4-5) ◽  
pp. 144-149
Author(s):  
N. I. Ayzatsky ◽  
A. N. Dovbnya ◽  
V. V. Zakutin ◽  
N. G. Reshetnyak ◽  
V. P. Romas'ko ◽  
...  
Keyword(s):  
Electron Beam ◽  
Secondary Emission ◽  
Electron Beam Generation ◽  
Beam Generation ◽  
Emission Cathode

scholarly journals Carbon Nanotube Electron Sources: From Electron Beams to Energy Conversion and Optophononics

2014 ◽  
Vol 2014 ◽  
pp. 1-23 ◽  
Author(s):  
Alireza Nojeh
Keyword(s):  
Carbon Nanotubes ◽  
Field Emission ◽  
Electron Emission ◽  
Electron Beams ◽  
Thermionic Emission ◽  
Secondary Emission ◽  
Electron Sources ◽  
Field Emitters ◽  
Electron Microscopes ◽  
Electron Emitters

Carbon nanotubes have a host of properties that make them excellent candidates for electron emitters. A significant amount of research has been conducted on nanotube-based field-emitters over the past two decades, and they have been investigated for devices ranging from flat-panel displays to vacuum tubes and electron microscopes. Other electron emission mechanisms from carbon nanotubes, such as photoemission, secondary emission, and thermionic emission, have also been studied, although to a lesser degree than field-emission. This paper presents an overview of the topic, with emphasis on these less-explored mechanisms, although field-emission is also discussed. We will see that not only is electron emission from nanotubes promising for electron-source applications, but also its study could reveal unusual phenomena and open the door to new devices that are not directly related to electron beams.

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