Experimental Study of Damage Mechanism of Carbon Nanotube as Nanocomponent of Electronic Devices Under High Current Density

2014 ◽  
Vol 136 (4) ◽  
Author(s):  
Kazuhiko Sasagawa ◽  
Kazuhiro Fujisaki ◽  
Jun Unuma ◽  
Ryota Azuma
Keyword(s):  
Carbon Nanotubes ◽  
Joule Heating ◽  
Current Density ◽  
High Current Density ◽  
Damage Mechanism ◽  
Cathode Side ◽  
Testing System ◽  
High Current ◽  
Multiwalled Carbon ◽  
And Migration

The damage mechanisms of carbon nanotubes are considered to be the oxidation by Joule heating and migration of carbon atoms by high-density electron flows. In this study, a high current density testing system was designed and applied to multiwalled carbon nanotubes (MWCNTs) collected at the gap between thin-film electrodes. Local evaporation of carbon atoms occurred on the cathode side of the MWCNTs under relatively low current density conditions, and the center area of the MWCNTs under high current density conditions. The damaged morphology could be explained by considering both Joule heating and electromigration behavior of MWCNTs.

Experimental Study of Damage Mechanism of Carbon Nanotube as Nano-Component of Electronic Devices Under High Current Density

2013 ◽  
Author(s):  
Kazuhiko Sasagawa ◽  
Kazuhiro Fujisaki ◽  
Jun Unuma ◽  
Ryota Azuma
Keyword(s):  
Carbon Nanotube ◽  
Current Density ◽  
High Current Density ◽  
Electronic Devices ◽  
Damage Mechanism ◽  
Cathode Side ◽  
Testing System ◽  
High Current ◽  
Lower Oxygen ◽  
Microscopic Studies

Carbon nanotube (CNT) has a great tolerance to high current density which is a cause of electromigration (EM). Therefore, CNT is expected to use as the materials of nanoscale components of electronic devices. The damage mechanisms of CNT are regarded as the effects of oxidation by Joule heating and/or the EM by high-density electron flows. In this study, we investigated the damage mechanism of CNT structures used as nano-component of electronic devices. An EM acceleration testing system was designed using the CNT structures collected at the gap of thin-film electrodes. The EM tests were conducted under the several kinds of current density conditions and the surrounding environments. An indicator of lifetime was determined by voltage measurements during the acceleration tests and their fracture phenomena were evaluated by means of microscopic observations. As the results, the amounts of lifetime of CNT were longer in the lower oxygen concentrations than in the air condition. In the microscopic studies, it was confirmed that the local evaporation of carbon atoms due to oxidation appeared at the cathode side of the CNT structures under low current density, and the center area of CNT under high current density. Both types of damage morphologies induced by oxidation and EM were observed at the damaged CNT. The results showed the dominant damage mechanism alternated between oxidation and EM depending on current density under oxygen rich conditions.

High Current Density Planar Field Electron Emitters with Carbon Nanotubes

2010 ◽  
Vol 19 (1-2) ◽  
pp. 100-104 ◽  
Author(s):  
A. L. Musatov ◽  
K. R. Izrael'yants ◽  
A. B. Ormont ◽  
E. G. Chirkova ◽  
E. F. Kukovitsky
Keyword(s):  
Carbon Nanotubes ◽  
Current Density ◽  
High Current Density ◽  
High Current ◽  
Field Electron ◽  
Electron Emitters

Microstructural Evolution and Migration Mechanism Study in a Eutectic Sn-37Pb Lap Joint Under High Current Density

2017 ◽  
Vol 46 (8) ◽  
pp. 5028-5038 ◽  
Author(s):  
Zhihao Zhang ◽  
Huijun Cao ◽  
Haifeng Yang ◽  
Yong Xiao ◽  
Mingyu Li ◽  
...  
Keyword(s):  
Microstructural Evolution ◽  
Current Density ◽  
High Current Density ◽  
High Current ◽  
Lap Joint ◽  
Mechanism Study ◽  
Migration Mechanism ◽  
And Migration

Field Emission Study of Carbon Nanotubes: High Current Density From Nanotube Bundle Arrays

2004 ◽  
Author(s):  
M. J. Bronikowski ◽  
H. M. Manohara ◽  
P. H. Siegel ◽  
B. D. Hunt
Keyword(s):  
Carbon Nanotubes ◽  
Field Emission ◽  
High Current Density ◽  
High Current ◽  
Multiwalled Carbon ◽  
Nanotube Bundles ◽  
Emission Behavior ◽  
Emission Study ◽  
Nanotube Bundle ◽  
Field Emission Performance

We have investigated the field emission behavior of lithographically patterned bundles of multiwalled carbon nanotubes arranged in a variety of array geometries. Such arrays of nanotube bundles are found to perform significantly better in field emission than arrays of isolated nanotubes or dense, continuous mats of nanotubes, with the field emission performance depending on the bundle diameter and inter-bundle spacing. Arrays of 2-μm diameter nanotube bundles spaced 5 μm apart (edge-to-edge spacing) produced the largest emission densities, routinely giving 1.5 to 1.8 A/cm2 at ∼ 4 V/μm electric field, and >6 A/cm2 at 20 V/μm.

High-Current-Density field emission from self-heating printed carbon nanotubes

2016 ◽  
Vol 24 (4) ◽  
pp. 273-277 ◽  
Author(s):  
Qilong Wang ◽  
Cairu Yu ◽  
Yusong Di ◽  
Zhuoya Zhu ◽  
Xiaobing Zhang ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Field Emission ◽  
Current Density ◽  
High Current Density ◽  
Density Field ◽  
High Current ◽  
Self Heating

Emission characteristics of planar field electron emitters containing carbon nanotubes operating in the high current density mode

Carbon ◽  
2010 ◽  
Vol 48 (7) ◽  
pp. 1889-1896 ◽  
Author(s):  
K.R. Izrael’yants ◽  
A.L. Musatov ◽  
A.B. Ormont ◽  
E.G. Chirkova ◽  
E.F. Kukovitsky
Keyword(s):  
Carbon Nanotubes ◽  
Current Density ◽  
High Current Density ◽  
Emission Characteristics ◽  
High Current ◽  
Field Electron ◽  
Electron Emitters

Modeling of Temperature Increase Due to Joule Heating During Electromigration Measurements

1996 ◽  
Vol 427 ◽  
Author(s):  
H. C. Louie Liu ◽  
S. P. Murarka
Keyword(s):  
Joule Heating ◽  
Current Density ◽  
High Current Density ◽  
Test Surface ◽  
High Current ◽  
Electrical Field ◽  
Iteration Functions ◽  
Electrical Analogy ◽  
Heat Conduction And Convection ◽  
Applied Electrical Field

AbstractElectromigration (EM), the mass transport phenomenon under applied electrical field, is known to cause degradation in interconnections and thus to compromise the devices' reliability. High current density and high temperature conditions are usually adopted to evaluate the EM lifetime. Such high current density will raise the temperature at the test sites because of Joule heating. Thus the actual temperature on the test surface, not the ambient temperature, is an important parameter affecting the lifetime of the metallization. A simple model is proposed here to predict the temperature rise in such interconnections and the calculated values agree well with the experimentally measured rise in temperature. Only heat conduction and convection are considered and illustrative equivalent electrical analogy technique is used to solve the problem. This model, using a commercially available spreadsheet and its iteration functions, is shown to match closely with experimental results.

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