Application of phase-imaging tapping-mode atomic-force microscopy to investigate the grain growth and surface morphology of TiSi[sub 2]

2002 ◽  
Vol 20 (5) ◽  
pp. 1866 ◽  
Author(s):  
C. H. Pang ◽  
P. Hing ◽  
A. See
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Grain Growth ◽  
Phase Imaging ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

scholarly journals From Images to Interactions: High-Resolution Phase Imaging in Tapping-Mode Atomic Force Microscopy

2001 ◽  
Vol 80 (6) ◽  
pp. 3009-3018 ◽  
Author(s):  
Martin Stark ◽  
Clemens Möller ◽  
Daniel J. Müller ◽  
Reinhard Guckenberger
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Phase Imaging ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Tapping-mode atomic force microscopy and phase-imaging in higher eigenmodes

1999 ◽  
Vol 74 (22) ◽  
pp. 3296-3298 ◽  
Author(s):  
Robert W. Stark ◽  
Tanja Drobek ◽  
Wolfgang M. Heckl
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Imaging ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Phase imaging and stiffness in tapping-mode atomic force microscopy

1997 ◽  
Vol 375 (2-3) ◽  
pp. L385-L391 ◽  
Author(s):  
S.N. Magonov ◽  
V. Elings ◽  
M.-H. Whangbo
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Imaging ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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