X-ray photoelectron spectroscopy and static secondary ion mass spectroscopy study of activation mechanism of Zr–V low activation temperature nonevaporable getter films

Activation Mechanism ◽

Spectroscopy Study ◽

Activation Temperature ◽

X Ray ◽

Phosphorus Behavior in Heavily Phosphorus-Doped Silicon Surfaces due to Annealing. X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy.

Shinku ◽

10.3131/jvsj.38.295 ◽

1995 ◽

Vol 38 (3) ◽

pp. 295-298 ◽

Cited By ~ 2

Author(s):

Wen Biao YING ◽

Yusuke MIZOKAWA ◽

Yoshitomo KAMIURA ◽

Yong Bing YU ◽

Masafumi NISHIMATSU ◽

...

Keyword(s):

Mass Spectroscopy ◽

Silicon Surfaces ◽

X Ray ◽

Doped Silicon ◽

Phosphorus Doped ◽

Composition Analysis of High-Stable Transparent Conductive Zinc Oxide by X-ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy

Japanese Journal of Applied Physics ◽

10.7567/jjap.50.121101 ◽

2011 ◽

Vol 50 (12R) ◽

pp. 121101 ◽

Cited By ~ 1

Author(s):

Takashi Kuchiyama ◽

Shigehiko Hasegawa ◽

Kenji Yamamoto ◽

Yuden Teraoka ◽

Hajime Asahi

Keyword(s):

Zinc Oxide ◽

Mass Spectroscopy ◽

Composition Analysis ◽

X Ray ◽

Study of Asphaltene Adsorption on Kaolinite by X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy

Energy & Fuels ◽

10.1021/ef4001314 ◽

2013 ◽

Vol 27 (5) ◽

pp. 2465-2473 ◽

Cited By ~ 32

Author(s):

Shanshan Wang ◽

Qi Liu ◽

Xiaoli Tan ◽

Chunming Xu ◽

Murray R. Gray

Keyword(s):

Mass Spectroscopy ◽

Time Of Flight ◽

X Ray ◽

Studies of Ion-Selective Solvent Polymeric Membranes by X-ray Photoelectron Spectroscopy and Time-of-Flight Static Secondary Ion Mass Spectroscopy

Analytical Chemistry ◽

10.1021/ac980341j ◽

1998 ◽

Vol 70 (20) ◽

pp. 4241-4246 ◽

Cited By ~ 17

Author(s):

Qingshan Ye ◽

George Horvai ◽

András Tóth ◽

Imre Bertóti ◽

Marc Botreau ◽

...

Keyword(s):

Mass Spectroscopy ◽

Time Of Flight ◽

Polymeric Membranes ◽

Selective Solvent ◽

X Ray ◽

A preliminary study of pure metal surfaces using Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS)

Surface Science ◽

10.1016/0039-6028(75)90160-0 ◽

1975 ◽

Vol 53 (1) ◽

pp. 636-648 ◽

Cited By ~ 12

Author(s):

M. Gettings ◽

J.P. Coad

Keyword(s):

Auger Electron Spectroscopy ◽

Mass Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Pure Metal ◽

X Ray ◽

Preliminary Study ◽

Wet-cleaning of MgO(001): Modification of surface chemistry and effects on thin film growth investigated by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.4975595 ◽

2017 ◽

Vol 35 (2) ◽

pp. 021407 ◽

Cited By ~ 16

Author(s):

Arnaud Le Febvrier ◽

Jens Jensen ◽

Per Eklund

Keyword(s):

Thin Film ◽

Surface Chemistry ◽

Mass Spectroscopy ◽

Film Growth ◽

Time Of Flight ◽

Thin Film Growth ◽

X Ray ◽

X-ray Photoelectron Spectroscopy and Time-Of-Flight Secondary Ion Mass Spectroscopy studies of electrodeposited molybdenum oxysulfide cathodes for lithium and lithium-ion microbatteries

Journal of Solid State Electrochemistry ◽

10.1007/s10008-007-0389-y ◽

2007 ◽

Vol 12 (3) ◽

pp. 273-285 ◽

Cited By ~ 8

Author(s):

V. Yufit ◽

D. Golodnitsky ◽

L. Burstein ◽

M. Nathan ◽

E. Peled

Keyword(s):

Mass Spectroscopy ◽

Time Of Flight ◽

Lithium Ion ◽

X Ray ◽

Spectroscopy Studies ◽

Incorporation of OH radicals in anodic silicon oxide films studied by secondary-ion mass spectroscopy, X-ray photoelectron spectroscopy and ir analysis

Thin Solid Films ◽

10.1016/s0040-6090(05)80042-2 ◽

1990 ◽

Vol 193-194 ◽

pp. 325-332 ◽

Cited By ~ 26

Author(s):

I. Montero ◽

L. Galán ◽

E. de la Cal ◽

J.M. Albella ◽

J.C. Pivin

Keyword(s):

Mass Spectroscopy ◽

Silicon Oxide ◽

Oxide Films ◽

Oh Radicals ◽

X Ray ◽

Ir Analysis ◽

X-ray diffraction, photoluminescence and secondary ion mass spectroscopy study of GaN films grown on Si(111) substrate by vacuum reactive evaporation

Semiconductor Science and Technology ◽

10.1088/0268-1242/15/7/301 ◽

2000 ◽

Vol 15 (7) ◽

pp. 649-652 ◽

Cited By ~ 7

Author(s):

Haoxiang Zhang ◽

Zhizhen Ye ◽

Binghui Zhao ◽

Hongxue Liu

Keyword(s):

Mass Spectroscopy ◽

Spectroscopy Study ◽

X Ray Diffraction ◽

X Ray ◽

Reactive Evaporation ◽

Oxidation of polycrystalline indium studied by x-ray photoelectron spectroscopy and static secondary ion mass spectroscopy

Journal of Applied Physics ◽

10.1063/1.327991 ◽

1980 ◽

Vol 51 (5) ◽

pp. 2620 ◽

Cited By ~ 101

Author(s):

R. W. Hewitt ◽

Nicholas Winograd

Keyword(s):

Mass Spectroscopy ◽

X Ray ◽