In situ investigation of the passivation of Si and Ge by electron cyclotron resonance plasma enhanced chemical vapor deposition of SiO2
1996 ◽
Vol 14
(3)
◽
pp. 1687
◽
2002 ◽
Vol 235
(1-4)
◽
pp. 333-339
◽
1995 ◽
Vol 05
(C5)
◽
pp. C5-671-C5-677
1998 ◽
Vol 16
(3)
◽
pp. 1912-1916
◽
1997 ◽
Vol 292
(1-2)
◽
pp. 124-129
◽
1995 ◽
Vol 13
(1)
◽
pp. 118
◽
1997 ◽
Vol 36
(Part 1, No. 11)
◽
pp. 6909-6914
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