Visualization of defects in nitride semiconductors by electron channeling (Conference Presentation)

Author(s):  
Carol Trager-Cowan ◽  
Aeshah Alasamari ◽  
William Avis ◽  
Jochen Bruckbauer ◽  
Paul Edwards ◽  
...  
2014 ◽  
Vol 20 (S3) ◽  
pp. 1024-1025
Author(s):  
C. Trager-Cowan ◽  
G. Naresh-Kumar ◽  
N. Allehiani ◽  
S. Kraeusel ◽  
B. Hourahine ◽  
...  

Author(s):  
David C. Joy

Electron channeling patterns (ECP) were first found by Coates (1967) while observing a large bulk, single crystal of silicon in a scanning electron microscope. The geometric pattern visible was shown to be produced as a result of the changes in the angle of incidence, between the beam and the specimen surface normal, which occur when the sample is examined at low magnification (Booker, Shaw, Whelan and Hirsch 1967).A conventional electron diffraction pattern consists of an angularly resolved intensity distribution in space which may be directly viewed on a fluorescent screen or recorded on a photographic plate. An ECP, on the other hand, is produced as the result of changes in the signal collected by a suitable electron detector as the incidence angle is varied. If an integrating detector is used, or if the beam traverses the surface at a fixed angle, then no channeling contrast will be observed. The ECP is thus a time resolved electron diffraction effect. It can therefore be related to spatially resolved diffraction phenomena by an application of the concepts of reciprocity (Cowley 1969).


2014 ◽  
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pp. 232111 ◽  
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Santino D. Carnevale ◽  
Julia I. Deitz ◽  
John A. Carlin ◽  
Yoosuf N. Picard ◽  
Marc De Graef ◽  
...  

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Ari Blumer ◽  
Marzieh Baan ◽  
Zak Blumer ◽  
Jacob Boyer ◽  
Tyler J. Grassman

1975 ◽  
Vol 31 (2) ◽  
pp. 503-510 ◽  
Author(s):  
Th. Bronder ◽  
J. Jakschik

2000 ◽  
Author(s):  
Qixin Guo ◽  
Mitsuhiro Nishio ◽  
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2015 ◽  
Vol 30 (20) ◽  
pp. 2977-2990 ◽  
Author(s):  
Ingo Tischer ◽  
Matthias Hocker ◽  
Benjamin Neuschl ◽  
Manfred Madel ◽  
Martin Feneberg ◽  
...  

Abstract


2013 ◽  
Vol 26 (5) ◽  
pp. 805-809 ◽  
Author(s):  
Guigang Zhang ◽  
Mingwen Zhang ◽  
Xinxin Ye ◽  
Xiaoqing Qiu ◽  
Sen Lin ◽  
...  

1985 ◽  
Vol 57 (5) ◽  
pp. 1661-1664 ◽  
Author(s):  
H. Park ◽  
J. O. Kephart ◽  
R. K. Klein ◽  
R. H. Pantell ◽  
B. L. Berman ◽  
...  

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