On-line data access interface for vegetation database at the Tuapkhat massif' cliff

2020 ◽  
Author(s):  
Elena Zhuk ◽  
Sergey Krylenko ◽  
Anastasiya Lukinykh
Keyword(s):  
Data Access ◽  
On Line ◽  
Vegetation Database

On-line atomic data access

1996 ◽  
Author(s):  
David R. Schultz ◽  
Jeffrey K. Nash
Keyword(s):  
Data Access ◽  
Atomic Data ◽  
On Line

scholarly journals The ORFEUS Data Center

1994 ◽  
Vol 37 (5) ◽  
Author(s):  
B. Dost
Keyword(s):  
The Netherlands ◽  
Data Center ◽  
Data Centers ◽  
Data Access ◽  
High Quality ◽  
On Line ◽  
Key Issues ◽  
Access And Quality ◽  
The University ◽  
Meteorological Institute

1993 the ORFEUS Data Center (ODC; Dost, 1991) changed hosting organisation. It moved within the Netherlands from the University of Utrecht to the Royal Netherlands Meteorological Institute (KNM1) in de Bilt. This change in hosting organisation was necessary to ensure a longer term stability in the operation of the ODC. Key issues for the ODC are the rapid on-line data access and quality controlled, complete and efficient off-line data access. During 1992 the ODC became the European node in the international SPYDER system which provides near real-time access to digital broadband data from selected high quality stations. Electronic messages trigger soveral centers well distributed over the globe. These centers then collect the data by modem from selected stations in their region. Finally, data are distributed between data centers over internet.

scholarly journals The Working Group III on data exchange

1994 ◽  
Vol 37 (5) ◽  
Author(s):  
B. Dost
Keyword(s):  
Data Center ◽  
Data Exchange ◽  
Data Centers ◽  
Data Access ◽  
Group Iii ◽  
On Line ◽  
Key Issues ◽  
Access And Quality ◽  
The University ◽  
Meteorological Institute

n 1993 the ORFEUS Data Center (ODC; Dost, 1991) changed hosting organisation. It moved within the Netherlands from the University of Utrecht to the Royal Netherlands Meteorological Institute (KNM1) in de Bilt. This change in hosting organisation was necessary to ensure a longer term stability in the operation of the ODC. Key issues for the ODC are the rapid on-line data access and quality controlled, complete and efficient off-line data access. During 1992 the ODC became the European node in the international SPYDER system which provides near real-time access to digital broadband data from selected high quality stations. Electronic messages trigger soveral centers well distributed over the globe. These centers then collect the data by modem from selected stations in their region. Finally, data are distributed between data centers over internet.

On-Line Approaches to Data Delivery and Visualisation in Landscape Planning and Management

2012 ◽  
Vol 1 (1) ◽  
pp. 31-41 ◽  
Author(s):  
Ian D. Bishop
Keyword(s):  
Landscape Planning ◽  
Data Access ◽  
Data Delivery ◽  
Collaborative Virtual Environment ◽  
Specific Data ◽  
The Public ◽  
On Demand ◽  
Planning And Management ◽  
On Line ◽  
Cooperative Decision Making

Those involved in planning and management in landscape have long recognised the value of good information provided in the form of timely, appropriate and digestible data. Whether the data is part of government infrastructure or is augmented by contributions from the public, it is apparent that on-line delivery can help ensure that the best available data is accessible while visualisation techniques can make the data easier to interpret. A collaborative virtual environment then allows for cooperative decision-making in a well informed situation. Add smartphones into the technology mix and augmented reality presentation allows for in-field collaboration and also on-demand location specific data access and capture. A series of projects are described which illustrate this potential. A scenario for application in a situation of emergency management in the landscape concludes the paper.

scholarly journals Balkan Vegetation Database (BVD) – updated information and current status

2020 ◽  
Vol 1 ◽  
pp. 151-153
Author(s):  
Kiril Vassilev ◽  
Hristo Pedashenko ◽  
Alexandra Alexandrova ◽  
Alexandar Tashev ◽  
Anna Ganeva ◽  
...  
Keyword(s):  
Bosnia And Herzegovina ◽  
Data Access ◽  
Balkan Peninsula ◽  
Current Status ◽  
Vegetation Types ◽  
Plot Size ◽  
Total Cover ◽  
Phytosociological Relevés ◽  
Vegetation Database ◽  
Different Levels

The Balkan Vegetation Database (BVD; GIVD ID: EU-00-019) is a regional database, which was established in 2014. It comprises phytosociological relevés covering various vegetation types from nine countries of the Balkan Peninsula (Albania – 153 relevés, Bosnia and Herzegovina – 1715, Bulgaria – 12,282, Greece – 465, Croatia – 69, Kosovo – 493, Montenegro – 440, North Macedonia – 13 and Serbia – 2677). Currently, it contains 18,306 relevés (compared to 9.580 in 2016), and most of them (82.8%) are geo-referenced. The database includes both digitized relevés from the literature (65.6%) and unpublished data (34.5%). Plot size is available for 84.7% of all relevés. During the last four years some “header data information” was improved e.g. elevation (now available for 83.4% of all relevés), aspect (67.7%), slope (66%), total cover of vegetation (54.3%), cover of tree, shrub, herb, bryophyte and lichen layers (27.1%, 20.1%, 40.2%, 11.5% and 2.1%), respectively. Data access is either semi-restricted (65.6%) or restricted (34.4%). Most relevés (84.6%) are classified to syntaxa of different levels. The database has been used for numerous studies with various objectives from floristic, vegetation and habitat-related topics, to macroecological studies at the local, regional, national, continental and global levels. During the last four years, BVD data were requested from 111 different projects via the EVA and sPlot databases.

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

Design and calibration of an IVEM for general 3-dimensional imaging of non-diffracting materials

1992 ◽  
Vol 50 (2) ◽  
pp. 1040-1041
Author(s):  
Neil Rowlands ◽  
Jeff Price ◽  
Michael Kersker ◽  
Seichi Suzuki ◽  
Steve Young ◽  
...  
Keyword(s):  
3D Imaging ◽  
Tomographic Reconstruction ◽  
Three Dimensional ◽  
3 Dimensional ◽  
3D Microstructure ◽  
Image Translation ◽  
Digital Correlation ◽  
On Line ◽  
Mechanical Stage ◽  
Projection Angle

Three-dimensional (3D) microstructure visualization on the electron microscope requires that the sample be tilted to different positions to collect a series of projections. This tilting should be performed rapidly for on-line stereo viewing and precisely for off-line tomographic reconstruction. Usually a projection series is collected using mechanical stage tilt alone. The stereo pairs must be viewed off-line and the 60 to 120 tomographic projections must be aligned with fiduciary markers or digital correlation methods. The delay in viewing stereo pairs and the alignment problems in tomographic reconstruction could be eliminated or improved by tilting the beam if such tilt could be accomplished without image translation.A microscope capable of beam tilt with simultaneous image shift to eliminate tilt-induced translation has been investigated for 3D imaging of thick (1 μm) biologic specimens. By tilting the beam above and through the specimen and bringing it back below the specimen, a brightfield image with a projection angle corresponding to the beam tilt angle can be recorded (Fig. 1a).

Software pattern recognition applied to nanodiffraction patterns from a STEM instrument

1986 ◽  
Vol 44 ◽  
pp. 694-695
Author(s):  
G.Y. Fan ◽  
J.M. Cowley
Keyword(s):  
Image Processing ◽  
Pattern Recognition ◽  
Computer Software ◽  
Processing System ◽  
Light Level ◽  
Host Computer ◽  
Low Light ◽  
Image Processing System ◽  
Recent Developments ◽  
On Line

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.

Thickness Measurement in the AEM by Macintosh-Based Analysis of Two-Beam Convergent Beam Patterns

1990 ◽  
Vol 48 (2) ◽  
pp. 504-505
Author(s):  
John F. Mansfield ◽  
Douglas C. Crawford
Keyword(s):  
Electron Microscope ◽  
Video Camera ◽  
Thickness Measurement ◽  
Specimen Thickness ◽  
Crystalline Materials ◽  
Beam Dynamic ◽  
Line Measurement ◽  
On Line ◽  
Image Position ◽  
Convergent Beam

A method has been developed that allows on-line measurement of the thickness of crystalline materials in the analytical electron microscope. Two-beam convergent beam electron diffraction (CBED) patterns are digitized from a JEOL 2000FX electron microscope into an Apple Macintosh II microcomputer via a Gatan #673 CCD Video Camera and an Imaging Systems Technology Video 1000 frame-capture board. It is necessary to know the lattice parameters of the sample since measurements are made of the spacing of the diffraction discs in order to calibrate the pattern. The sample thickness is calculated from measurements of the spacings of the fringes that are seen in the diffraction discs. This technique was pioneered by Kelly et al, who used the two-beam dynamic theory of MacGillavry relate the deviation parameter (Si) of the ith fringe from the exact Bragg condition to the specimen thickness (t) with the equation:Where ξg, is the extinction distance for that reflection and ni is an integer.

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