Implementation of a high precision star centroid extraction algorithm based on hardware platform

2020 ◽  
Author(s):  
Wenchao Jiang ◽  
Shiqiao Qin ◽  
Dongkai Dai ◽  
Bo Ren ◽  
Zhisheng Wang
Keyword(s):  
High Precision ◽  
Hardware Platform ◽  
Extraction Algorithm

High-precision location for occluded reference hole based on robust extraction algorithm

2020 ◽  
Vol 32 (3) ◽  
pp. 035021
Author(s):  
Huacheng Lou ◽  
Min Lu ◽  
Haihua Cui ◽  
Tao Jiang ◽  
Wei Tian ◽  
...  
Keyword(s):  
High Precision ◽  
Extraction Algorithm

scholarly journals Optical Image Generation and High-precision Line-of-Sight Extraction for Mars Approach Navigation

2018 ◽  
Vol 72 (1) ◽  
pp. 229-252 ◽  
Author(s):  
Xiuqiang Jiang ◽  
Shuang Li ◽  
Long Gu ◽  
Jun Sun ◽  
Dongdong Xiao
Keyword(s):  
High Precision ◽  
Level Line ◽  
Simulation System ◽  
Optical Image ◽  
Least Square ◽  
Line Of Sight ◽  
Image Generation ◽  
Image Simulation ◽  
Extraction Algorithm ◽  
Generation Procedure

A high-precision line-of-sight extraction technique is essential for autonomous optical navigation during the Mars approach phase. To support future Mars exploration missions, an optical image simulation system is a necessary ground verification facility for Mars image generation and line-of-sight extraction algorithm tests. In this paper, an optical image generation procedure is first developed according to projection relationships, reference flight profiles and camera parameters. Next, a hybrid image processing and subpixel-level line-of-sight extraction algorithm is proposed through modification of moment-based sub-pixel edge detection and improvement of direct least-square fitting approaches. Finally, an optical image simulation system is established, and the experimental results show that the proposed procedure can effectively simulate the optical image in the field-of-view of a Mars spacecraft, and the hybrid extraction algorithm can obtain high-precision Mars centroid information.

High precision indoor model contour extraction algorithm based on geometric information

2021 ◽  
Author(s):  
Tianxing Jin ◽  
Jiayan Zhuang ◽  
Jiangjian Xiao ◽  
Kangkang Song ◽  
Yue Cui ◽  
...  
Keyword(s):  
High Precision ◽  
Contour Extraction ◽  
Geometric Information ◽  
Extraction Algorithm

Study on the Virtual Instrument for Coaxiality Error

2012 ◽  
Vol 220-223 ◽  
pp. 45-48
Author(s):  
Li Jie Chen ◽  
Ping Zou
Keyword(s):  
High Precision ◽  
Virtual Instrument ◽  
Least Square Method ◽  
Least Square ◽  
Manufacturing Cost ◽  
Zone Method ◽  
Hardware Platform ◽  
Experimental Teaching ◽  
Data Acquisition Card ◽  
Minimum Zone

Used LabWindows/CVI as software platform, existing apparatus in laboratory and a data acquisition card as hardware platform, the virtual instrument for coaxiality error was developed. It combines the theory to measure form and position error with technology about virtual instrument. Coaxiality error by least square method and the minimum zone method is measured. The image of coaxiality error can be displayed on the screen to analyse the causes of error, so as to control the manufacturing error. The virtual instrument has the advantages of high precision, stablity, low manufacturing cost, especially the excellent function expandability. It can be used for experimental teaching and the actual production.

A File Encryption System Based on Fingerprint-Embedded Storage

2013 ◽  
Vol 446-447 ◽  
pp. 1017-1021
Author(s):  
Gao Feng Huang
Keyword(s):  
High Precision ◽  
High Stability ◽  
Experimental Results ◽  
Hardware Platform ◽  
Fast Speed ◽  
Encryption And Decryption ◽  
Embedded Chip

A file encryption system based on fingerprint-embedded storage is proposed in this paper. The system uses the MBF200 to carry out the collection of fingerprints, uses the embedded chip ARM2410 to process and store the fingerprints as a hardware platform, and customs the man-machine interfaces for the processes of file encryption and decryption on the host side in accordance with the needs of development. Experimental results show that the system is easy to operate, with high stability, versatility, fast speed and high precision in the fingerprint acquisition.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

Digital differential hysteresis iimage processing displays what the microscope acquires but the eye can't see

1995 ◽  
Vol 53 ◽  
pp. 642-643
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
Image Processing ◽  
Visual System ◽  
High Precision ◽  
Image Data ◽  
Processing Technology ◽  
Output Data ◽  
Contrast Resolution ◽  
Pixel Intensity ◽  
Data Reading ◽  
Hysteresis Properties

Differential hysteresis processing is a new image processing technology that provides a tool for the display of image data information at any level of differential contrast resolution. This includes the maximum contrast resolution of the acquisition system which may be 1,000-times higher than that of the visual system (16 bit versus 6 bit). All microscopes acquire high precision contrasts at a level of <0.01-25% of the acquisition range in 16-bit - 8-bit data, but these contrasts are mostly invisible or only partially visible even in conventionally enhanced images. The processing principle of the differential hysteresis tool is based on hysteresis properties of intensity variations within an image.Differential hysteresis image processing moves a cursor of selected intensity range (hysteresis range) along lines through the image data reading each successive pixel intensity. The midpoint of the cursor provides the output data. If the intensity value of the following pixel falls outside of the actual cursor endpoint values, then the cursor follows the data either with its top or with its bottom, but if the pixels' intensity value falls within the cursor range, then the cursor maintains its intensity value.

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