Charge collection in multielectrode CdZnTe detectors

Author(s):  
Thomas H. Prettyman ◽  
Morag K. Smith ◽  
Paul N. Luke ◽  
Mark S. Amman ◽  
Julie S. Lee
2020 ◽  
Vol 15 (09) ◽  
pp. P09017-P09017
Author(s):  
J. Yang ◽  
Y.L. Li ◽  
Y. Tian ◽  
L. Xu ◽  
Y.M. Cai ◽  
...  

1997 ◽  
Vol 487 ◽  
Author(s):  
M-A. Gagliardi ◽  
S. Nenonen ◽  
T. Gagliardi ◽  
K. T. Hjelt ◽  
M. Juvonen ◽  
...  

AbstractThe electrical and charge collection properties of a semiconductor detector play an important role in a spectrometer's final performance. However, the studies of these properties often concentrate on only a few samples. In this work over 100 CdZnTe detectors from 12 different growth boules were characterized with one of the following test methods. The composition uniformity was evaluated with low temperature photoluminescence (PL) measurements. From the current-voltage characteristics the differences in CdZnTe detector resistivities were investigated. Charge collection properties, μτ-products, and energy resolutions were characterized with spectroscopic methods using an alpha and isotopic sources. A wide selection of test results are presented indicating the variety of CdZnTe material.


1997 ◽  
Vol 487 ◽  
Author(s):  
M-A. Gagliardi ◽  
S. Nenonen ◽  
T. Gagliardi ◽  
L. Aleksejeva ◽  
V. Ivanov ◽  
...  

AbstractOne of the main electronic noise sources of a room temperature spectroscopy system is the leakage current of a detector. It can be reduced with a pn-junction type detector structure such as a M-i-n configuration, and with cooling. In this work eight CdZnTe detectors with a M-i-n structure were fabricated by indium diffusion. The junction was characterized by a currentvoltage technique. Detector electrical, charge collection and spectroscopic properties were compared to the ones received with the traditional electroless Au contacts, before the junction formation. As a result of the indium diffusion an improved detector leakage current performance was achieved. However, a corresponding improvement in the detector energy resolution was not always observed due to the CdZnTe charge collection properties and process variables.


2012 ◽  
Vol 111 (11) ◽  
pp. 113715 ◽  
Author(s):  
Aaron L. Washington ◽  
Lucile C. Teague ◽  
Martine C. Duff ◽  
Arnold Burger ◽  
Michael Groza ◽  
...  

Sensors ◽  
2021 ◽  
Vol 21 (9) ◽  
pp. 3260
Author(s):  
Kjell A. L. Koch-Mehrin ◽  
Sarah L. Bugby ◽  
John E. Lees ◽  
Matthew C. Veale ◽  
Matthew D. Wilson

Cadmium zinc telluride (CdZnTe) detectors are known to suffer from polarization effects under high photon flux due to poor hole transport in the crystal material. This has led to the development of a high-flux capable CdZnTe material (HF-CdZnTe). Detectors with the HF-CdZnTe material have shown promising results at mitigating the onset of the polarization phenomenon, likely linked to improved crystal quality and hole carrier transport. Better hole transport will have an impact on charge collection, particularly in pixelated detector designs and thick sensors (>1 mm). In this paper, the presence of charge sharing and the magnitude of charge loss were calculated for a 2 mm thick pixelated HF-CdZnTe detector with 250 μm pixel pitch and 25 μm pixel gaps, bonded to the STFC HEXITEC ASIC. Results are compared with a CdTe detector as a reference point and supported with simulations from a Monte-Carlo detector model. Charge sharing events showed minimal charge loss in the HF-CdZnTe, resulting in a spectral resolution of 1.63 ± 0.08 keV Full Width at Half Maximum (FWHM) for bipixel charge sharing events at 59.5 keV. Depth of interaction effects were shown to influence charge loss in shared events. The performance is discussed in relation to the improved hole transport of HF-CdZnTe and comparison with simulated results provided evidence of a uniform electric field.


2011 ◽  
Vol 20 (3) ◽  
pp. 398-402 ◽  
Author(s):  
Alexander Oh ◽  
Thorsten Wengler ◽  
Mahfuza Ahmed ◽  
Cinzia Da Via ◽  
Stephen Watts

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