The critical temperature of two-dimensional and three-dimensional Ising models

2003 ◽  
Vol 71 (8) ◽  
pp. 806-808 ◽  
Author(s):  
B. Liu ◽  
M. Gitterman
Keyword(s):  
Critical Temperature ◽  
Three Dimensional ◽  
Ising Models ◽  
Two Dimensional

scholarly journals The interaction of atoms and molecules with solid surfaces XII—Critical phenomena in a two-dimensional gas

1937 ◽  
Vol 163 (912) ◽  
pp. 132-138 ◽  
Keyword(s):  
Critical Temperature ◽  
Equation Of State ◽  
Critical Phenomena ◽  
Three Dimensional ◽  
Inert Gases ◽  
Two Dimensional ◽  
Lennard Jones ◽  
Low Concentrations ◽  
High Concentrations ◽  
The Right

In a paper recently published by Professor Lennard-Jones and the author (Lennard-Jones and Devonshire 1937) the equation of state of a gas at high concentrations has been calculated in terms of the interatomic fields. The equation found had the right kind of properties and, in particular, using the interatomic fields previously determined from the observed equation of state at low concentrations (Lennard-Jones 1931), the critical temperature was given correctly to within a few degrees for the inert gases. In this paper we shall apply the same method to determine the equation of state of a two-dimensional gas. Although such a gas cannot strictly be obtained in practice, an inert gas adsorbed on a surface (or in fact any gas held by van der Waals’ forces only) would probably behave very much like one, the fluctuations of the potential field over the surface not being of much importance. In confirmation of this it may be noted that the specific heat of argon adsorbed on charcoal was found by Simon (Simon 1935) to be equal to that of a perfect two-dimensional gas down to 60° K. A gas adsorbed on a liquid would be an even better representation of a two-dimensional one. Some measurements on the adsorption of krypton and xenon on liquid mercury have been made by Cassel and Neugebauer (Cassel and Neugebauer 1936), and they found no trace of any critical phenomena though they worked at temperatures considerably below the critical temperature of xenon. Our results are in agreement with this, for they show that the critical temperature of a two-dimensional gas should be about half that of the corresponding three-dimensional one.

The temperature and frequency dependence of the inelastic neutron scattering from an Ising magnet

1968 ◽  
Vol 46 (7) ◽  
pp. 799-802 ◽  
Author(s):  
G. A. T. Allan ◽  
D. D. Betts
Keyword(s):  
Inelastic Scattering ◽  
Inelastic Neutron Scattering ◽  
Three Dimensional ◽  
Ising Models ◽  
Inelastic Neutron ◽  
Square Lattice ◽  
Two Dimensional ◽  
Scattering Function ◽  
Ising Magnet ◽  
Exact Energy

The magnetic inelastic scattering of neutrons from a spin-[Formula: see text] Ising system is considered. For the two-dimensional plane square lattice, the exact energy distribution of the scattering is obtained at all temperatures. It consists of a number of discrete levels, the envelope of which varies most markedly in the critical region. Some qualitative projections are also made concerning three-dimensional systems. For both two- and three-dimensional Ising models there can be no wave-vector dependence of the inelastic scattering function because there is correlation only between z components of the spins on different sites.

HIGH-TEMPERATURE SUSCEPTIBILITY SERIES FOR SQUARE-LATTICE ISING MODEL WITH FIRST AND SECOND NEIGHBOUR INTERACTIONS

2002 ◽  
Vol 16 (32) ◽  
pp. 4919-4922
Author(s):  
KEH YING LIN ◽  
MALL CHEN
Keyword(s):  
High Temperature ◽  
Critical Temperature ◽  
Ising Model ◽  
Critical Exponent ◽  
Ising Models ◽  
Temperature Series ◽  
Square Lattice ◽  
Zero Field ◽  
Two Dimensional ◽  
Temperature Susceptibility

We have calculated the high-temperature series expansion of the zero-field susceptibility of the square-lattice Ising model with first and second neighbour interactions to the 20th order by computer. Our results extend the previous calculation by Hsiao and Lin to two more orders. We use the Padé approximants to estimate the critical exponent γ and the critical temperature. Our result 1.747 < γ < 1.753 supports the universality conjecture that all two-dimensional Ising models have the same critical exponent γ = 1.75.

High Resolution Microscopy of Multi-Layered Biological Crystals

1982 ◽  
Vol 40 ◽  
pp. 80-83
Author(s):  
H.A. Cohen ◽  
T.W. Jeng ◽  
W. Chiu
Keyword(s):  
High Resolution ◽  
Low Dose ◽  
Three Dimensional ◽  
Data Interpretation ◽  
Two Dimensional ◽  
Biological Objects ◽  
Density Maps ◽  
Density Map ◽  
Complex Crystal ◽  
High Resolution Microscopy

This tutorial will discuss the methodology of low dose electron diffraction and imaging of crystalline biological objects, the problems of data interpretation for two-dimensional projected density maps of glucose embedded protein crystals, the factors to be considered in combining tilt data from three-dimensional crystals, and finally, the prospects of achieving a high resolution three-dimensional density map of a biological crystal. This methodology will be illustrated using two proteins under investigation in our laboratory, the T4 DNA helix destabilizing protein gp32*I and the crotoxin complex crystal.

Instrumentation For Quantitative Microscopy

1977 ◽  
Vol 35 ◽  
pp. 206-209
Author(s):  
B. Ralph ◽  
A.R. Jones
Keyword(s):  
Volume Fraction ◽  
Three Dimensional ◽  
Two Dimensional ◽  
Automatic Data ◽  
Phase Volume Fraction ◽  
Statistical Confidence ◽  
Resultant Data ◽  
Automatic Data Collection ◽  
Third Dimension ◽  
Evolution Of Microstructure

In all fields of microscopy there is an increasing interest in the quantification of microstructure. This interest may stem from a desire to establish quality control parameters or may have a more fundamental requirement involving the derivation of parameters which partially or completely define the three dimensional nature of the microstructure. This latter categorey of study may arise from an interest in the evolution of microstructure or from a desire to generate detailed property/microstructure relationships. In the more fundamental studies some convolution of two-dimensional data into the third dimension (stereological analysis) will be necessary.In some cases the two-dimensional data may be acquired relatively easily without recourse to automatic data collection and further, it may prove possible to perform the data reduction and analysis relatively easily. In such cases the only recourse to machines may well be in establishing the statistical confidence of the resultant data. Such relatively straightforward studies tend to result from acquiring data on the whole assemblage of features making up the microstructure. In this field data mode, when parameters such as phase volume fraction, mean size etc. are sought, the main case for resorting to automation is in order to perform repetitive analyses since each analysis is relatively easily performed.

A linearity test for thick specimens imaged by HVEM over a 180° angular range

1991 ◽  
Vol 49 ◽  
pp. 552-553
Author(s):  
Yu Liu
Keyword(s):  
Phase Contrast ◽  
Three Dimensional ◽  
Angular Range ◽  
Two Dimensional ◽  
Back Projection ◽  
Line Integral ◽  
Exponential Law ◽  
Transmission Electron ◽  
Absorption Law ◽  
Linearity Test

The image obtained in a transmission electron microscope is the two-dimensional projection of a three-dimensional (3D) object. The 3D reconstruction of the object can be calculated from a series of projections by back-projection, but this algorithm assumes that the image is linearly related to a line integral of the object function. However, there are two kinds of contrast in electron microscopy, scattering and phase contrast, of which only the latter is linear with the optical density (OD) in the micrograph. Therefore the OD can be used as a measure of the projection only for thin specimens where phase contrast dominates the image. For thick specimens, where scattering contrast predominates, an exponential absorption law holds, and a logarithm of OD must be used. However, for large thicknesses, the simple exponential law might break down due to multiple and inelastic scattering.

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