Interpreting Micromorphology: Scanning Electron Microscopy . Systematic and Evolutionary Applications. Proceedings of a symposium, Reading, England, Apr. 1970. V. H. Heywood, Ed. Published for the Systematics Association by Academic Press, New York, 1971. x, 332 pp., illus. $19. Systematics Association Special Volume No. 4.

Science ◽

10.1126/science.174.4004.50.a ◽

1971 ◽

Vol 174 (4004) ◽

pp. 50-50

Author(s):

Thomas J. M. Schopf

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Academic Press ◽

Special Volume ◽

Scanning Electron

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Biomedical research applications of scanning electron microscopy: Vols. 1 and 2.: G. M. Hodges and R. C. Hallowes, eds. Academic Press, London - New York - Toronto - Sydney - San Francisco 1979-1980 vol. i (363 pages, 214 figures, isbn 0-12-351001-5) vol.

Scanning ◽

10.1002/sca.4950040413 ◽

1981 ◽

Vol 4 (4) ◽

pp. 208-208

Author(s):

Yu. A. Rovensky ◽

J. M. Vasiliev

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

San Francisco ◽

Biomedical Research ◽

Academic Press ◽

Scanning Electron

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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis. Patrick Echlin. Springer, New York; 2009, 330 pages. ISBN 978-0-387-85730-5(Hardcover).

Microscopy and Microanalysis ◽

10.1017/s1431927609991152 ◽

2010 ◽

Vol 16 (3) ◽

pp. 358-359

Author(s):

Iolo ap Gwynn

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Sample Preparation ◽

X Ray ◽

Scanning Electron

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Biological Low-Voltage Scanning Electron Microscopy. Edited by Heide Schatten and James B. Pawley. Springer Science+Business Media, LLC, New York; 2008, 317 pages. ISBN 978-0-387-72970-1; e-ISBN 978-0-387-72972-5

Microscopy and Microanalysis ◽

10.1017/s143192760999095x ◽

2009 ◽

Vol 15 (6) ◽

pp. 564-566

Author(s):

Thomas L. Hayes

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Low Voltage ◽

Business Media ◽

Voltage Scanning ◽

Scanning Electron

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GOLDSTEIN, J., NEWBURY, D., JOY, D., LYMAN, C., ECHLIN, P., LIFSHIN, E., SAWYER, L. & MICHAEL, J. 2003. Scanning Electron Microscopy and X-Ray Microanalysis, 3rd ed. xix + 689 pp. New York, Boston, Dordrecht, London, Moscow: Kluwer Academic/Plenum Publishers. Price Euros 76.00, US $75.00, £48.00 (hard covers). ISBN 0 306 47292 9

Geological Magazine ◽

10.1017/s0016756803238838 ◽

2003 ◽

Vol 140 (6) ◽

pp. 728-729 ◽

Author(s):

R. B. Pearce

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

X Ray ◽

Scanning Electron

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KRINSLEY, D. H., PYE, K., BOGGS, S., JR & TOVEY, N. K. 1998. Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks. ix+193 pp. Cambridge, New York, Melbourne: Cambridge University Press. Price £50.00, US $80.00 (hard covers). ISBN 0 521 45346 1.

Geological Magazine ◽

10.1017/s0016756801235596 ◽

2001 ◽

Vol 138 (4) ◽

pp. 499-508

Author(s):

Anton Kearsley

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Image Analysis ◽

Sedimentary Rocks ◽

Cambridge University ◽

Backscattered Scanning Electron Microscopy ◽

Scanning Electron

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REED, S. J. B. 1996. Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. xiv + 201 pp. Cambridge, New York, Port Chester, Melbourne, Sydney: Cambridge University Press. Price £50.00, US $80.00 (hard covers); £17.95, US $29.95 (paperback). ISBN 0 521 448280 1; 0 521 48350 6 (pb).

Geological Magazine ◽

10.1017/s0016756897436464 ◽

1997 ◽

Vol 134 (2) ◽

pp. 269-281

Author(s):

Allan Pring

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Electron Microprobe ◽

Microprobe Analysis ◽

Electron Microprobe Analysis ◽

Cambridge University ◽

Scanning Electron

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D. E. Newbury, D. C. Joy, P. Echlin, C. E. Fiori & J. I. Goldstein 1986. Advanced Scanning Electron Microscopy and X-Ray Microanalysis. xii + 45 pp. New York, London: Plenum Press. Price US $37.50 (hard covers). ISBN 0 306 42140 2.

Geological Magazine ◽

10.1017/s0016756800024298 ◽

1986 ◽

Vol 123 (6) ◽

pp. 709-709

Author(s):

S. J. B. R.

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

X Ray ◽

Scanning Electron

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Scanning Electron Microscopy for the Life Sciences H.Schatten (ed.) New York: Cambridge University Press, 2013. 298pp. ISBN: 978-0-521-19599-7. Hardback: US$120.

Marine Ecology ◽

10.1111/maec.12222 ◽

2014 ◽

Vol 37 (1) ◽

pp. 235-235

Author(s):

Jean-Marie Volland

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Life Sciences ◽

Cambridge University ◽

Scanning Electron

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R. G. Kessel and C. Y. Shih, Scanning Electron Microscopy in Biology. A Students' Atlas on Biological Organization. 345 S., 22 Abb., 132 Taf. Berlin–Heidelberg–New York 1974: Springer-Verlag. DM 48,50

Zeitschrift für allgemeine Mikrobiologie ◽

10.1002/jobm.3630160320 ◽

1976 ◽

Vol 16 (3) ◽

pp. 240-241

Author(s):

Ch. Schönfeld

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Biological Organization ◽

Scanning Electron

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Examination of Metal Threads From Some Xv/Xvi Century Italian Textiles by Scanning Electron Microscopy-Energy Dispersive X-Ray Spectrometry

MRS Proceedings ◽

10.1557/proc-267-309 ◽

1992 ◽

Vol 267 ◽

Author(s):

D. Montegut ◽

C. Adelson ◽

R.J. Koestler ◽

N. Indictor

Keyword(s):

Electron Microscopy ◽

New York ◽

Scanning Electron Microscopy ◽

Recent Literature ◽

Energy Dispersive ◽

Late Medieval ◽

X Ray ◽

Metropolitan Museum Of Art ◽

Historic Markers ◽

Scanning Electron

ABSTRACTScanning electron microscopy and energy dispersive x-ray spectrometry (SEM-EDS) has been employed along with the light microscope to describe some metal threads taken from some late Medieval and Renaissance textiles attributed to Italy in the collection of the Metropolitan Museum of Art, New York. Comparisons are made within the group studied and to those descriptions of metal threads found in recent literature. The results are discussed in terms of geographic and historic markers of the metal thread technology employed.

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