scholarly journals Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy

Science ◽  
1995 ◽  
Vol 267 (5194) ◽  
pp. 68-71 ◽  
Author(s):  
F. J. Giessibl
2000 ◽  
Vol 39 (Part 2, No. 2A) ◽  
pp. L113-L115 ◽  
Author(s):  
Kousuke Yokoyama ◽  
Taketoshi Ochi ◽  
Akira Yoshimoto ◽  
Yasuhiro Sugawara ◽  
Seizo Morita

2014 ◽  
Vol 25 (17) ◽  
pp. 175701 ◽  
Author(s):  
Stefan A L Weber ◽  
Jason I Kilpatrick ◽  
Timothy M Brosnan ◽  
Suzanne P Jarvis ◽  
Brian J Rodriguez

1997 ◽  
Vol 113-114 ◽  
pp. 364-370 ◽  
Author(s):  
Yasuhiro Sugawara ◽  
Hitoshi Ueyama ◽  
Takayuki Uchihashi ◽  
Masahiro Ohta ◽  
Seizo Morita ◽  
...  

1995 ◽  
Vol 3 (4) ◽  
pp. 6-7
Author(s):  
Stephen W. Carmichael

For biologic studies, atomic force microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM) because it has the capability of imaging non-conducting biologic specimens. However, STM generally gives better resolution than AFM, and we're talking about resolution on the atomic scale. In a recent article, Franz Giessibl (Atomic resolution of the silicon (111)- (7X7) surface by atomic force microscopy, Science 267:68-71, 1995) has demonstrated that atoms can be imaged by AFM.


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