Studying electric field profiles in GaAs-based detector structures by Kelvin probe force microscopy

Technical Physics Letters ◽

10.1134/s1063785010050147 ◽

2010 ◽

Vol 36 (5) ◽

pp. 436-438 ◽

Author(s):

M. D. Vilisova ◽

V. P. Germogenov ◽

O. Zh. Kaztaev ◽

V. A. Novikov ◽

I. V. Ponomarev ◽

...

Keyword(s):

Electric Field ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Study of electric field distribution in AlGalnP light-emitting diode by Kelvin probe force microscopy

Journal of Physics Conference Series ◽

10.1088/1742-6596/541/1/012057 ◽

2014 ◽

Vol 541 ◽

pp. 012057

Author(s):

V L Oleynik ◽

I A Prudaev ◽

Vad A Novikov ◽

Yu L Ryaboshtan ◽

P V Gorlachuk

Keyword(s):

Electric Field ◽

Field Distribution ◽

Electric Field Distribution ◽

Light Emitting Diode ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Light Emitting ◽

Force Microscopy

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Interpreting Kelvin probe force microscopy under an applied electric field: local electronic behavior of vapor–liquid–solid Si nanowires

Nanotechnology ◽

10.1088/0957-4484/24/20/205704 ◽

2013 ◽

Vol 24 (20) ◽

pp. 205704 ◽

Author(s):

Nathaniel J Quitoriano ◽

Robert N Sanderson ◽

Sung-Soo Bae ◽

Regina Ragan

Keyword(s):

Electric Field ◽

Applied Electric Field ◽

Kelvin Probe Force Microscopy ◽

Si Nanowires ◽

Kelvin Probe ◽

Vapor Liquid Solid ◽

Force Microscopy ◽

Electronic Behavior ◽

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Three-dimensional observation of nanoscale ferroelectric domains using scanning nonlinear dielectric microscopy with electric field correction by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/17/7/s10 ◽

2006 ◽

Vol 17 (7) ◽

pp. S162-S166 ◽

Author(s):

Tomoyuki Sugihara ◽

Yasuo Cho

Keyword(s):

Electric Field ◽

Three Dimensional ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Nonlinear Dielectric ◽

Force Microscopy ◽

Ferroelectric Domains

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Vector electric field measurement via position-modulated Kelvin probe force microscopy

Applied Physics Letters ◽

10.1063/1.4999172 ◽

2017 ◽

Vol 111 (17) ◽

pp. 173106 ◽

Author(s):

Ryan P. Dwyer ◽

Louisa M. Smieska ◽

Ali Moeed Tirmzi ◽

John A. Marohn

Keyword(s):

Electric Field ◽

Field Measurement ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Electric Field Measurement ◽

Force Microscopy

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Imaging the Photocarrier Dynamics in Organic, Hybrid and Two-Dimensional Photovoltaic Materials by Time-Resolved Kelvin Probe Force Microscopy

10.29363/nanoge.fallmeeting.2018.014 ◽

2018 ◽

Author(s):

Benjamin GREVIN

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Organic Hybrid ◽

Photovoltaic Materials

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Energy-Level Alignment at Interfaces between Transition-Metal Dichalcogenide Monolayers and Metal Electrodes Studied with Kelvin Probe Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c01612 ◽

2021 ◽

Author(s):

Pavel A. Markeev ◽

Emad Najafidehaghani ◽

Ziyang Gan ◽

Kai Sotthewes ◽

Antony George ◽

...

Keyword(s):

Transition Metal ◽

Energy Level ◽

Kelvin Probe Force Microscopy ◽

Transition Metal Dichalcogenide ◽

Kelvin Probe ◽

Metal Electrodes ◽

Force Microscopy ◽

Energy Level Alignment

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Real-space measurement of potential distribution in PECVD ONO electrets by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/27/20/205703 ◽

2016 ◽

Vol 27 (20) ◽

pp. 205703 ◽

Author(s):

F Emmerich ◽

C Thielemann

Keyword(s):

Potential Distribution ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Space Measurement

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Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/19/14/145705 ◽

2008 ◽

Vol 19 (14) ◽

pp. 145705 ◽

Author(s):

Th Glatzel ◽

M Rusu ◽

S Sadewasser ◽

M Ch Lux-Steiner

Keyword(s):

Kelvin Probe Force Microscopy ◽

Surface Photovoltage ◽

Kelvin Probe ◽

Force Microscopy

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Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

Microelectronic Engineering ◽

10.1016/j.mee.2016.02.046 ◽

2016 ◽

Vol 157 ◽

pp. 71-77 ◽

Author(s):

Krzysztof Gajewski ◽

Witold Szymański ◽

Piotr Niedzielski ◽

Teodor Gotszalk

Keyword(s):

High Strength ◽

Kelvin Probe Force Microscopy ◽

Low Density Polyethylene ◽

Low Density ◽

Kelvin Probe ◽

Force Microscopy

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