General Method to Design Reversible Universal n-Bit Up/Down Counters

2020 ◽  
Vol 29 (10) ◽  
pp. 2050165
Author(s):  
Zeinab Kalantari ◽  
Mohammad Eshghi ◽  
Majid Mohammadi ◽  
Somayeh Jassbi

With the growing trend towards reducing the size of electronic devices, reducing power consumption has become one of the major concerns of circuit designers, and designing reversible circuits is one of the approaches proposed for reducing power consumption. Although several studies have been done in the field of synthesizing combinational reversible circuits, little work has been done for designing reversible sequential circuits. Furthermore, many researches in this context use traditional designs which replace latches, flip-flops and associated combinational gates with their reversible counterparts. This traditional technique is not very promising, because it leads to high quantum cost (QC) and garbage outputs. Recently, researchers have proposed direct design of reversible sequential circuits using Reed Muller expressions to obtain next state output. Since most sequential circuits have multiple outputs, using common product terms between multiple outputs might decrease QC significantly. In this paper, a modular and low QC design for a synchronous reversible [Formula: see text]-bit up/down counter with parallel load capability is presented. In this design, the common terms among multiple outputs are used efficiently, which leads to a low QC for the counter. A general formula to evaluate the QC of our proposed reversible counter is presented. This result shows that in our proposed design by increasing the number of bits of counter ([Formula: see text], the QC increases linearly, while in previous works by increasing the number of bits of counter, the QC increases exponentially.

Author(s):  
Ahmed K. Jameil ◽  
Yasir Amer Abbas ◽  
Saad Al-Azawi

Background: The designed circuits are tested for faults detection in fabrication to determine which devices are defective. The design verification is performed to ensure that the circuit performs the required functions after manufacturing. Design verification is regarded as a test form in both sequential and combinational circuits. The analysis of sequential circuits test is more difficult than in the combinational circuit test. However, algorithms can be used to test any type of sequential circuit regardless of its composition. An important sequential circuit is the finite impulse response (FIR) filters that are widely used in digital signal processing applications. Objective: This paper presented a new design under test (DUT) algorithm for 4-and 8-tap FIR filters. Also, the FIR filter and the proposed DUT algorithm is implemented using field programmable gate arrays (FPGA). Method: The proposed test generation algorithm is implemented in VHDL using Xilinx ISE V14.5 design suite and verified by simulation. The test generation algorithm used FIR filtering redundant faults to obtain a set of target faults for DUT. The fault simulation is used in DUT to assess the benefit of test pattern in fault coverage. Results: The proposed technique provides average reductions of 20 % and 38.8 % in time delay with 57.39 % and 75 % reductions in power consumption and 28.89 % and 28.89 % slices reductions for 4- and 8-tap FIR filter, respectively compared to similar techniques. Conclusions: The results of implementation proved that a high speed and low power consumption design can be achieved. Further, the speed of the proposed architecture is faster than that of existing techniques.


2013 ◽  
Vol 739 ◽  
pp. 423-426
Author(s):  
De Yue Cao ◽  
Yi Zou

This paper briefly explains the advantages of LED and the classification of LED backlight and explores the pattern of LED backlight based on dynamic regional control technology to overcome and improve the inherent problems of LCD TV monitor on purpose of reducing power consumption and saving energy.


Author(s):  
Alexander Chatzigeorgiou ◽  
Spiridon Nikolaidis

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