INFLUENCE OF THE SUBSTRATE ON THE CRYSTALLINE PHASE AND MORPHOLOGY OF POLY (VINYLIDENE FLUORIDE) (PVDF) THIN FILM
The effect of substrate on the crystalline phase and morphology of the poly (vinylidene fluoride) (PVDF) thin film has been investigated. The solution of PVDF/Hexamethyl phosphoramide (HMPA) was deposited on four different substrates, namely, silicon (Si), glass (SiO2), indium tin oxide (ITO) coated glass and silver (Ag) coated glass respectively by using the spin coating technique. The crystalline structure was investigated using X-ray diffraction (XRD) and Fourier transform infrared (FTIR) techniques. The morphology was determined using scanning electron microscopy (SEM). XRD demonstrated that the structure of PVDF thin films on each substrate is [Formula: see text]-phase with different orientations of the molecular chains. FTIR results confirmed XRD that the samples contain [Formula: see text]-phase. SEM shows spherulites structure, which is rough and porous, besides, the size of spherulites and the porosity are different for each sample. The size of spherulites is in average diameter range (1–6[Formula: see text][Formula: see text]m) and this range is attributed to the [Formula: see text]-phase. The nucleation process of [Formula: see text]-phase on the various substrates attributed either to the match of polymer-substrate or to the electrostatic interaction. Among the substrates used, the ITO substrate exhibited a greater tendency for [Formula: see text]-phase formation.