Acceptors in n-Type Silicon Crystals Induced by Plastic Deformation

1980 ◽  
Vol 19 (10) ◽  
pp. L629-L632 ◽  
Author(s):  
Haruhiko Ono ◽  
Koji Sumino
2013 ◽  
Vol 69 (9) ◽  
pp. 686-689 ◽  
Author(s):  
Mukannan Arivanandhan ◽  
Raira Gotoh ◽  
Kozo Fujiwara ◽  
Satoshi Uda ◽  
Yasuhiro Hayakawa ◽  
...  

2016 ◽  
Vol 24 (2) ◽  
Author(s):  
L. Bychto ◽  
M. Maliński

AbstractThe paper presents experimental results of the lifetime of light induced excess carriers in the n−type silicon. The lifetimes of carriers of silicon crystals were analysed as a function of the intensity of light illuminating the sample. As a measurement method of the lifetime of carriers, the photoacoustic method in a transmission configuration with different surfaces was used. The dependence character was next analysed in the frame of the Shockley Reed Hall statistics in approximation of the light low intensity.


1993 ◽  
Vol 36 (5) ◽  
pp. 469-475
Author(s):  
S. A. Antipov ◽  
I. L. Bataronov ◽  
A. I. Drozhzhin ◽  
A. P. Ermakov ◽  
A. M. Roshchupkin ◽  
...  

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