Quantum Interferometric Spectroscopy: A Novel Technique for Nanometer-Scale Characterization of Heterostructures

1995 ◽  
Vol 34 (Part 1, No. 8B) ◽  
pp. 4466-4469
Author(s):  
Kiyoshi Kanisawa ◽  
Masafumi Tanimoto
Keyword(s):  
Nanometer Scale ◽  
Novel Technique ◽  
Scale Characterization

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

Nanometer-scale characterization of exceptionally preserved bacterial fossils in Paleocene phosphorites from Ouled Abdoun (Morocco)

Geobiology ◽  
2013 ◽  
Vol 11 (2) ◽  
pp. 139-153 ◽  
Author(s):  
J. Cosmidis ◽  
K. Benzerara ◽  
E. Gheerbrant ◽  
I. Estève ◽  
B. Bouya ◽  
...  
Keyword(s):  
Nanometer Scale ◽  
Scale Characterization

Nanometer scale characterization of polymer films by atomic-force microscopy

2002 ◽  
Vol 181 (1) ◽  
pp. 457-466 ◽  
Author(s):  
Christian Teichert ◽  
Alfred Haas ◽  
Gernot M. Wallner ◽  
Reinhold W. Lang
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scale Characterization

Nanometer‐scale characterization of SiO2/Si with a scanning capacitance microscope

1996 ◽  
Vol 69 (26) ◽  
pp. 4050-4052 ◽  
Author(s):  
Hideto Tomiye ◽  
Takafumi Yao ◽  
Hiroshi Kawami ◽  
Tsukasa Hayashi
Keyword(s):  
Nanometer Scale ◽  
Scale Characterization
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