Noise Performance of Pseudomorphic AlGaAs/InGaAs/GaAs High Electron Mobility Transistors with Wide Head T-Shaped Gate Recessed by Electron Cyclotron Resonance Plasma Etching
1999 ◽
Vol 38
(Part 1, No. 2A)
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pp. 654-657
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2015 ◽
Vol 36
(4)
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pp. 315-317
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2011 ◽
Vol 29
(3)
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pp. 031204
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2012 ◽
Vol 27
(6)
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pp. 065018
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1985 ◽
Vol 32
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pp. 2528-2528
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2021 ◽
Vol 135
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pp. 106109