Fabrication and Characterization of Ferroelectric Gate Field-Effect Transistor Memory Based on Ferroelectric–Insulator Interface Conduction

2006 ◽  
Vol 45 (11) ◽  
pp. 8608-8610 ◽  
Author(s):  
Bong Yeon Lee ◽  
Takaki Minami ◽  
Takeshi Kanashima ◽  
Masanori Okuyama
2010 ◽  
Author(s):  
Matthew R. Leyden ◽  
Canan Schuman ◽  
Tal Sharf ◽  
Josh Kevek ◽  
Vincent T. Remcho ◽  
...  

2005 ◽  
Vol 409 (4-6) ◽  
pp. 187-191 ◽  
Author(s):  
Takayuki Nagano ◽  
Eiji Kuwahara ◽  
Toshio Takayanagi ◽  
Yoshihiro Kubozono ◽  
Akihiko Fujiwara

Sign in / Sign up

Export Citation Format

Share Document