Fabrication and Characterization of Ferroelectric Gate Field-Effect Transistor Memory Based on Ferroelectric–Insulator Interface Conduction
2006 ◽
Vol 45
(11)
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pp. 8608-8610
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2005 ◽
2014 ◽
Vol 24
(9)
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pp. 095005
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Keyword(s):
2005 ◽
Vol 409
(4-6)
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pp. 187-191
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Keyword(s):
Keyword(s):