Investigation of the Low-Frequency Noise Behavior and Its Correlation with the Subgap Density of States and Bias-Induced Instabilities in Amorphous InGaZnO Thin-Film Transistors with Various Oxygen Flow Rates

2012 ◽  
Vol 51 ◽  
pp. 100206
Author(s):  
Chan-Yong Jeong ◽  
Ick-Joon Park ◽  
In-Tak Cho ◽  
Jong-Ho Lee ◽  
Euo-Sik Cho ◽  
...  
Keyword(s):  
Thin Film ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Oxygen Flow ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Flow Rates ◽  
Amorphous Ingazno

Characterization of High-Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors by Low-Frequency Noise Measurements

2013 ◽  
Vol 34 (11) ◽  
pp. 1403-1405 ◽  
Author(s):  
Andreas Tsormpatzoglou ◽  
Nikolaos A. Hastas ◽  
Forough Mahmoudabadi ◽  
Nackbong Choi ◽  
Miltiadis K. Hatalis ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
High Current ◽  
Low Frequency Noise ◽  
Current Stress ◽  
Noise Measurements ◽  
Amorphous Ingazno

Low-Frequency Noise Characterization of Amorphous InGaZnO Thin-Film Transistors with Double-Stack Ga2O3/SiO2 Dielectric

2014 ◽  
Vol 3 (10) ◽  
pp. Q55-Q58 ◽  
Author(s):  
T. H. Chang ◽  
C. J. Chiu ◽  
S. J. Chang ◽  
T. H. Yang ◽  
S. L. Wu ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characterization ◽  
Amorphous Ingazno

Low-Frequency Noise Properties in Double-Gate Amorphous InGaZnO Thin-Film Transistors Fabricated by Back-Channel-Etch Method

2015 ◽  
Vol 36 (12) ◽  
pp. 1332-1335 ◽  
Author(s):  
Chan-Yong Jeong ◽  
Jong In Kim ◽  
Jong-Ho Lee ◽  
Jae-Gwang Um ◽  
Jin Jang ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Double Gate ◽  
Low Frequency Noise ◽  
Amorphous Ingazno

Density of States Extraction in Bulk Channel Area of a-Si:H Thin-Film Transistors by Using Low-Frequency Noise Analysis

2011 ◽  
Vol 378-379 ◽  
pp. 642-645
Author(s):  
Kyunghwan Lee ◽  
Younghwan Son ◽  
Jaeho Lee ◽  
Jae Hong Lee ◽  
Seunghyun Jang ◽  
...  
Keyword(s):  
Thin Film ◽  
Exponential Distribution ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Noise Analysis ◽  
Low Frequency ◽  
Frequency Noise ◽  
Noise Power ◽  
Low Frequency Noise ◽  
Band Tail

Density of states in the channel bulk area of a-Si:H thin-film transistors (TFTs) was extracted by using low-frequency noise analysis. The drain current noise power spectral density shows 1/ƒγ behavior at relatively high frequencies (ƒ > 1 kHz), which is due to the exponential distribution of tail states. For the analysis, the modified number fluctuation model which is correlated with mobility fluctuation was used. From the relationship (γ=1- kT/Et ) between exponent γ and the slope of exponential distribution Et of band tail states, the distribution of the band tail near conduction band was extracted.

Impact of High-kHfO2Dielectric on the Low-Frequency Noise Behaviors in Amorphous InGaZnO Thin Film Transistors

2010 ◽  
Vol 49 (10) ◽  
pp. 100205 ◽  
Author(s):  
Jae Chul Park ◽  
Sun Il Kim ◽  
Chang Jung Kim ◽  
Sungchul Kim ◽  
Dae Hwan Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Amorphous Ingazno

Low frequency noise in amorphous silicon thin film transistors with SiNx gate dielectric

2009 ◽  
Vol 105 (12) ◽  
pp. 124504 ◽  
Author(s):  
S. L. Rumyantsev ◽  
Sung Hun Jin ◽  
M. S. Shur ◽  
Mun-Soo Park
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Thin Film Transistors ◽  
Gate Dielectric ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Silicon Thin Film
Sign in / Sign up

Export Citation Format

Share Document