scholarly journals VC dimension and distribution-free sample-based testing

Author(s):  
Eric Blais ◽  
Renato Ferreira Pinto Jr. ◽  
Nathaniel Harms
Author(s):  
R. L. Lyles ◽  
S. J. Rothman ◽  
W. Jäger

Standard techniques of electropolishing silver and silver alloys for electron microscopy in most instances have relied on various CN recipes. These methods have been characteristically unsatisfactory due to difficulties in obtaining large electron transparent areas, reproducible results, adequate solution lifetimes, and contamination free sample surfaces. In addition, there are the inherent health hazards associated with the use of CN solutions. Various attempts to develop noncyanic methods of electropolishing specimens for electron microscopy have not been successful in that the specimen quality problems encountered with the CN solutions have also existed in the previously proposed non-cyanic methods.The technique we describe allows us to jet polish high quality silver and silver alloy microscope specimens with consistant reproducibility and without the use of CN salts.The solution is similar to that suggested by Myschoyaev et al. It consists, in order of mixing, 115ml glacial actic acid (CH3CO2H, specific wt 1.04 g/ml), 43ml sulphuric acid (H2SO4, specific wt. g/ml), 350 ml anhydrous methyl alcohol, and 77 g thiourea (NH2CSNH2).


1973 ◽  
Vol 2 (4) ◽  
pp. 337-356
Author(s):  
Ronald Randles ◽  
Robert Hogg
Keyword(s):  

1957 ◽  
Vol 2 (4) ◽  
pp. 102-103
Author(s):  
ALLEN L. EDWARDS
Keyword(s):  

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