Electrical Characterization of GaN Metal Oxide Semiconductor Diodes Using MgO as the Gate Oxide
2002 ◽
Vol 149
(8)
◽
pp. G482
◽
Keyword(s):
2002 ◽
Vol 5
(7)
◽
pp. G51
◽
2011 ◽
Vol 32
(6)
◽
pp. 752-754
◽
2008 ◽
Vol 47
(4)
◽
pp. 2680-2683
◽
2004 ◽
Vol 22
(6)
◽
pp. 2691
◽