Use Of A Solid-State Detector for the Analysis of X-Rays Excited in Silicate Rocks by Alpha-Particle Bombardment

1971 ◽  
Vol 15 ◽  
pp. 388-406 ◽  
Author(s):  
Ernest J. Franzgrote
Keyword(s):  
Alpha Particle ◽  
Particle Bombardment ◽  
Pulse Height ◽  
Silicon Detector ◽  
Alpha Particles ◽  
X Rays ◽  
Solid State Detector ◽  
X Ray ◽  
Alpha Scattering ◽  
Silicate Rocks

The analysis of alpha-excited X-rays has been studied as a possible addition to the alpha-scattering technique used on the Surveyor spacecraft for the first in situ chemical analyses of the lunar surface.Targets of pure elements, simple compounds, and silicate rocks have been exposed to alpha particles and other radiation from a curium-214 source and the resulting X-ray spectra measured by means of a cooled lithium-drifted silicon detector and pulse-height analysis.Alpha-particle bombardment is a simple and efficient means of X-ray excitation for light elements. Useful spectra of silicate rocks may be obtained in a few minutes with a source activity of 50 millicuries, a detector area of 0.1 cm2 and a sample distance of 3 cm. An advantage over electron excitation is the higher characteristic response relative to the bremsstrahlung continuum. Peak-to- background ratios of greater than 100 to 1 have been obtained for elemental targets. Relative efficiencies of X-ray excitation by alpha particles and by X-rays from the curium source have been determined.Resolution of the detector system used is approximately 150 eV for the lighter elements. This is sufficient to resolve the Kα X-rays of the geochemically important elements, Na, Mg, Al, and Si in silicate rocks. Although these and lighter elements are analyzed as well or better by the alpha-scattering and alpha-proton technique, the X-ray mode enables results to be obtained more quickly.The study shows that the addition of an X-ray mode to the alpha-scattering analysis technique would result in a significant improvement in analytical capability for the heavier elements. In particular, important indicators of geochemical differentiation such as K and Ca (which are only marginally separated in an alpha-scattering and alpha-proton analysis) may be determined quantitatively by measuring the alpha-excited X-rays. An X-ray detector is under consideration as an addition to an alpha-scattering instrument now under development for possible use on a Mars-lander mission.

scholarly journals Mixed ZnSxSe1–x Crystals as a Possible Material for Alpha-Particle and X-ray Detectors

2018 ◽  
Vol 63 (6) ◽  
pp. 546 ◽  
Author(s):  
O. G. Trubaieva ◽  
M. A. Chaika ◽  
O. V. Zelenskaya
Keyword(s):  
Sulfur Content ◽  
Alpha Particle ◽  
Light Yield ◽  
Alpha Particles ◽  
Mixed Crystals ◽  
Luminescence Spectra ◽  
X Rays ◽  
X Ray ◽  
Stockbarger Method ◽  
Luminescence Light

A possibility to use ZnSxSe1−x as a material for the detection of X-rays and alpha particles has been studied. The influence of the sulfur content on the properties of bulk ZnSxSe1−x crystals is analyzed. Six specimens with different component contents were grown, by using the Bridgman–Stockbarger method: ZnS0.07Se0.93, ZnS0.15Se0.85, ZnS0.22Se0.78, ZnS0.28Se0.72, ZnS0.32Se0.68, and ZnS0.39Se0.61. The intensity of X-ray luminescence spectra of ZnSxSe1−x crystals is found to increase with the sulfur content and reaches a maximum for the composition ZnS0.22Se0.78. The luminescence light yield of mixed ZnSxSe1−x crystals is higher than that of commercial ZnSe(Te) and ZnSe(Al) crystals. The advantages of mixed crystals based onZnSxSe1−x over the ZnS(Te) and ZnSe(Al) crystals have been discussed.

Going Nondispersive

1998 ◽  
Vol 4 (S2) ◽  
pp. 162-163
Author(s):  
Kurt F. J. Heinrich
Keyword(s):  
Electron Probe ◽  
Single Channel ◽  
Pulse Height ◽  
Silicon Detector ◽  
X Rays ◽  
X Ray ◽  
Energy Dispersion Spectrometer ◽  
Elementary Analysis ◽  
Geiger Muller Counter ◽  
Pulse Height Analysis

In February 1968 Ray Fitzgerald, Klaus Keil and myself published in Science a communication titled “Solid-State Energy-Dispersion Spectrometer for Electron Microprobe X-ray Analysis”. The authors describe the use of a lithium-drifted silicon detector for the direct identification of x-rays, without a diffracting crystal, in an electron probe. The subject of this paper was to modify profoundly the development of x-ray microanalysis in the years to follow.Pulse-height analysis of gamma rays detected in scintillation counters was widely used at the time. For radiation of energies below 30 keV, gas proportional counters were also employed. In elementary analysis by x-rays the poor energy resolution of these detectors limited the application of such a procedure, although single-channel pulse height analysis was employed as an adjunct to crystal spectrometers.In 1951, Raymond Castaing in his thesis described his invention of the electron probe microanalyzer, created by adding to a transmission electron microscope a curved-crystal spectrometer which focused the x-rays emitted by the specimen into a Geiger-Muller counter.

scholarly journals Micrometer-resolution imaging using MÖNCH: towards G2-less grating interferometry

2016 ◽  
Vol 23 (6) ◽  
pp. 1462-1473 ◽  
Author(s):  
Sebastian Cartier ◽  
Matias Kagias ◽  
Anna Bergamaschi ◽  
Zhentian Wang ◽  
Roberto Dinapoli ◽  
...  
Keyword(s):  
High Resolution ◽  
Silicon Detector ◽  
Limiting Factor ◽  
X Rays ◽  
X Ray ◽  
Charge Cloud ◽  
High Resolution Images ◽  
Resolution Imaging ◽  
Hybrid Silicon ◽  
Small Pixel

MÖNCH is a 25 µm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron applications where currently the detector is the limiting factor,e.g.inelastic X-ray scattering, Laue diffraction and soft X-ray or high-resolution color imaging. Due to the small pixel pitch, the charge cloud generated by absorbed X-rays is shared between neighboring pixels for most of the photons. Therefore, at low photon fluxes, interpolation algorithms can be applied to determine the absorption position of each photon with a resolution of the order of 1 µm. In this work, the characterization results of one of the MÖNCH prototypes are presented under low-flux conditions. A custom interpolation algorithm is described and applied to the data to obtain high-resolution images. Images obtained in grating interferometry experiments without the use of the absorption grating G2are shown and discussed. Perspectives for the future developments of the MÖNCH detector are also presented.

Applications of a Portable Radioisotope X-Ray Fluorescence Spectrometer to Analysis of Minerals and Alloys*

1967 ◽  
Vol 11 ◽  
pp. 249-274 ◽  
Author(s):  
J. R. Rhodes ◽  
T. Furuta
Keyword(s):  
Single Channel ◽  
Scintillation Counter ◽  
Pulse Height ◽  
X Rays ◽  
X Ray ◽  
Scattering Coefficients ◽  
Finite Samples ◽  
Counting Statistics ◽  
Fluorescence Spectrometer ◽  
Sulfur In Coal

AbstractA portable, battery-operated X-ray fluorescence analyzer weighing 15 lb is described, consisting of a Nal(Tl) scintillation-counter probe and an electronic unit with a single-channel pulse-height analyzer and reversible scaler. Radioisotope X-ray sources are used for excitation of the sample and, where necessary, balanced filters for resolution of neighboring characteristic X-rays. Emphasis has been placed on designing and producing an instrument that is easy and convenient to operate in laboratory, factory, or field conditions and that can equally well be used to measure extended surfaces, such as rock faces, or finite samples in the form of powders, briquettes, or liquids. The feasibility of the following analyses has been studied by using for each determination the appropriate radioisotope source and filters: sulfur in coal; calcium and iron in cement raw mix; copper in copper ores; and vanadium, chromium, molybdenum, and tungsten in steels. Detection limits, based on counting statistics obtained in count times of 10 to 100 sec, range from 0.03% for copper in ores to 0.2% for sulfur in coal. Both matrix absorption and enhancement effects were encountered and were eliminated or reduced substantially by suitable choice of source energy, by the use of nomograms, or by semiempirical correction factors based on attenuation or scattering coefficients.

Computer Code for Analysing X-Ray Fluorescence Spectra of Airborne Particulate Matter

1979 ◽  
Vol 23 ◽  
pp. 149-156 ◽  
Author(s):  
E.A. Drane ◽  
D.G. Rickel ◽  
W.J. Courtney ◽  
T.G. Dzubay
Keyword(s):  
Atmospheric Aerosols ◽  
Fluorescence Spectra ◽  
Pulse Height ◽  
Silicon Detector ◽  
Airborne Particulate Matter ◽  
Computer Code ◽  
Elemental Content ◽  
X Ray ◽  
Edxrf Analysis ◽  
Fluorescence Spectrometer

During recent years energy dispersive x-ray fluorescence (EDXRF) has been used to measure the elemental content of atmospheric aerosols. The code described here is used to reduce EDXRF data and determine the elemental composition of samples collected on membrane filters. The program has been specifically written for EDXRF analysis of size-fractionated aerosols collected by a dichotomous sampler.The x-ray fluorescence spectrometer used in our laboratory employs a pulsed-mode x-ray tube and a lithium-drifted silicon detector. Pulse-height spectra are produced for elements ranging in atomic number from Z = 13 to Z = 82 (corresponding to an energy range from 1.4 to 32.1 keV). Approximately uniform x-ray production is attained by producing independent spectra from three secondary targets (Ti, Mo, Sm).

Energy Dispersive Analysis for Adjacent Elements Using Two Single Channel Analyzers

1971 ◽  
Vol 15 ◽  
pp. 197-208
Author(s):  
Hubert K. Chow
Keyword(s):  
Single Channel ◽  
Matrix Effects ◽  
Pulse Height ◽  
Silicon Detector ◽  
Emission Spectra ◽  
Empirical Method ◽  
Energy Dispersive ◽  
Standard Samples ◽  
X Ray ◽  
Adjacent Element

Energy dispersive x-ray analysis has become an extremely useful analytical tool. The technique provides for the direct observation of x-ray emission spectra, eliminating the need for a dispersive crystal. The purpose of this reported investigation was to study the use of the technique with a simple pulse height analyzing system and to develop a routine method for correcting Interferences due to adjacent element spectral overlap and matrix effects.The analyzing system consists of a radioisotope source, a lithium drifted silicon detector, a preamplifier, an amplifier, two single channel analyzers and two digital ratemeters. In order to obtain results suitable for quantative measurement, a two-step empirical method was employed for the correction of peak overlapping and matrix effects. If two peaks in a spectrum overlap at their tails, one can set up a channel width of the analyzer to a region where there are no overlapping pulses. It is then possible to calibrate the ratio of the intensity obtained from this channel to that obtained from the whole peak in its pure state, i.e. without the appearance of a neighbor peak. The actual intensity of the peak in the overlapping spectrum is, therefore, the observed counts multiplied by the ratio. The next step is the correction of matrix effect by means of conventional empirical methods using standard samples. Two types of the samples, Zn-Cu powder mixtures and Ee-Cu in aqueous solutions, were studied to illustrate this method. The usefulness of applying the analyzing system and technique to industrial measurements, either on-line or batch, will also be discussed.

Escape Peaks in X-Ray Diffractometry*

1964 ◽  
Vol 8 ◽  
pp. 118-133 ◽  
Author(s):  
William Parrish
Keyword(s):  
Absorption Edge ◽  
Pulse Height ◽  
Pulse Amplitude ◽  
Silicon Powder ◽  
X Rays ◽  
Pulse Height Analyzer ◽  
Escape Peak ◽  
X Ray ◽  
Absorption Edge Energy ◽  
Detector Element

AbstractEscape peaks occur when the incident X-ray quantum, energy exceeds the absorption edge energy of the detector element and the resulting X-ray fluorescence is lost from the detector. The most common escape peaks result from 1 K-fluorescence in NaI-scintillation counters and Xe K-, Xe L-, and Kr K-fluorescence in proportional counters. The average pulse amplitude of the escape peak is proportional to the difference of the Energies of the incident and fluorescent X-rays. If the intensity of the escape peak is high as in the case of Mo Kα and a kryptoopreportional counter, and the lower level of the pulse height analyzer is raised to reject the escape peak, the quantum counting efficiency may be reduced by a factor of two. When the pulse height analyzer is set for characteristic incident radiation, escape peaks appear in powder patterns at small diffraction angles. These broad low-intensity peaks are often mistakenly identified as resulting from misalignment, scattering, etc. Each powder reflection can produce its own escape peak which occurs at an angle slightly smaller than the absorption edge of the detector element. In a silicon powder pattern the three strongest reflections produce three resolved escape peaks whose peak intensities are about 4% of their corresponding Cu Kα peaks when the X-ray tube is operated at 50 kV. The escape peak intensities decrease with decreasing X-ray tube voltage and disappear when the voltage is lower than the absorption edge energy of the detector element. Absorption edge peaks observed without the upper level of the pulse height analyzer are similar in appearance, intensity, and diffraction angle to the escape peaks. In complex powder patterns the escape peak pattern is unresolved and may produce a number of very broad peaks.

Measurement of Mass Absorption Coefficients Using Compton-Scattered Cu Radiation in X-ray Diffraction Analysis

1990 ◽  
Vol 34 ◽  
pp. 325-335 ◽  
Author(s):  
Steve J. Chipera ◽  
David L. Bish
Keyword(s):  
Chemical Composition ◽  
Solid State ◽  
Absorption Coefficient ◽  
Mass Absorption Coefficient ◽  
X Rays ◽  
X Ray Diffraction ◽  
Absorption Coefficients ◽  
Solid State Detector ◽  
X Ray ◽  
Mass Absorption

AbstractThe mass absorption coefficient is a useful parameter for quantitative characterization of materials. If the chemical composition of a sample is known, the mass absorption coefficient can be calculated directly. However, the mass absorption coefficient must be determined empirically if the chemical composition is unknown. Traditional methods for determining the mass absorption coefficient involve measuring the transmission of monochromatic X-rays through a sample of known thickness and density. Reynolds (1963,1967), however, proposed a method for determining the mass absorption coefficient by measuring the Compton or inelastic X-ray scattering from a sample using Mo radiation on an X-ray fluorescence spectrometer (XRF). With the recent advances in solid-state detectors/electronics for use with conventional powder diffractometers, it is now possible to readily determine mass absorption coefficients during routine X-ray diffraction (XRD) analyses.Using Cu Kα radiation and Reynolds’ method on a Siemens D-500 diffractometer fitted with a Kevex Si(Li) solid-state detector, we have measured the mass absorption coefficients of a suite of minerals and pure chemical compounds ranging in μ/ρ from graphite to Fe-metal (μ/ρ = 4.6-308 using Cu Kα radiation) to ±4.0% (lσ). The relationship between the known mass absorption coefficient and the inverse count rate is linear with a correlation coefficient of 0.997. Using mass absorption coefficients, phase abundances can be determined during quantitative XRD analysis without requiring the use of an internal standard, even when an amorphous component is present.

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